Koushu Satoh

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of producing an anodic bonded semiconductor sensor element
- Patent number 6,077,721
- Issue date Jun 20, 2000
- Nippondenso Co., Ltd.
- Tsuyoshi Fukada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor element mount and producing method therefor
- Patent number 5,736,061
- Issue date Apr 7, 1998
- Nippondenso Co. Ltd.
- Tsuyoshi Fukada
- G01 - MEASURING TESTING