Kouta KAMEISHI

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Yokkaichi Mie, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect inspection apparatus, defect inspection method, and recordin...
- Patent number 11,009,797
- Issue date May 18, 2021
- TOSHIBA MEMORY CORPORATION
- Kouta Kameishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 10,677,743
- Issue date Jun 9, 2020
- TOSHIBA MEMORY CORPORATION
- Keitarou Suzuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION APPARATUS, DEFECT INSPECTION METHOD, AND RECORDIN...
- Publication number 20200089131
- Publication date Mar 19, 2020
- Toshiba Memory Corporation
- Kouta KAMEISHI
- G06 - COMPUTING CALCULATING COUNTING