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Kouta KAMEISHI
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Yokkaichi Mie, JP
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Patents Grants
last 30 patents
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Patent Grant
Defect inspection apparatus, defect inspection method, and recordin...
Patent number
11,009,797
Issue date
May 18, 2021
TOSHIBA MEMORY CORPORATION
Kouta Kameishi
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Inspection apparatus and inspection method
Patent number
10,677,743
Issue date
Jun 9, 2020
TOSHIBA MEMORY CORPORATION
Keitarou Suzuki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DEFECT INSPECTION APPARATUS, DEFECT INSPECTION METHOD, AND RECORDIN...
Publication number
20200089131
Publication date
Mar 19, 2020
Toshiba Memory Corporation
Kouta KAMEISHI
G06 - COMPUTING CALCULATING COUNTING