Membership
Tour
Register
Log in
Koya KARINO
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Electronic device handling apparatus and electronic device testing...
Patent number
9,588,142
Issue date
Mar 7, 2017
Advantest Corporation
Toshiyuki Kiyokawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRONIC DEVICE HANDLING APPARATUS AND ELECTRONIC DEVICE TESTING...
Publication number
20160116503
Publication date
Apr 28, 2016
Advantest Corporation
Toshiyuki KIYOKAWA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE TEST APPARATUS AND METHOD OF TESTING ELECTRONIC D...
Publication number
20100147088
Publication date
Jun 17, 2010
Advantest Corporation
Akihiko Ito
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE CONVEYING METHOD AND ELECTRONIC DEVICE HANDLING A...
Publication number
20090314607
Publication date
Dec 24, 2009
Advantest Corporation
Koya Karino
G01 - MEASURING TESTING