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Hino, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Gas concentration measuring device
Patent number
10,598,601
Issue date
Mar 24, 2020
Yanmar Co., Ltd.
Yoshinori Fukui
G01 - MEASURING TESTING
Information
Patent Grant
Analyzing apparatus and exhaust gas treating system
Patent number
10,378,416
Issue date
Aug 13, 2019
Fuji Electric Co., Ltd.
Ryoichi Higashi
G01 - MEASURING TESTING
Information
Patent Grant
Non-dispersive infrared gas analyzer including gas-filled radiation...
Patent number
5,429,805
Issue date
Jul 4, 1995
Fuji Electric Co., Ltd.
Masahiro Uno
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
GAS CONCENTRATION MEASURING DEVICE
Publication number
20190094148
Publication date
Mar 28, 2019
Yanmar Co., Ltd.
Yoshinori FUKUI
G01 - MEASURING TESTING
Information
Patent Application
ANALYZING APPARATUS AND EXHAUST GAS TREATING SYSTEM
Publication number
20160348561
Publication date
Dec 1, 2016
Fuji Electric Co., Ltd.
Ryoichi HIGASHI
G01 - MEASURING TESTING