Kris Bhaskar

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Mode selection and defect detection training
- Patent number 11,769,242
- Issue date Sep 26, 2023
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D structure inspection or metrology using deep learning
- Patent number 11,644,756
- Issue date May 9, 2023
- KLA Corp.
- Scott A. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerated training of a machine learning based model for semicond...
- Patent number 11,580,375
- Issue date Feb 14, 2023
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagnostic systems and methods for deep learning models configured...
- Patent number 11,580,398
- Issue date Feb 14, 2023
- KLA-Tenor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Learnable defect detection for semiconductor applications
- Patent number 11,551,348
- Issue date Jan 10, 2023
- KLA Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-controller inspection system
- Patent number 11,415,526
- Issue date Aug 16, 2022
- KLA Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Grant
Active learning for defect classifier training
- Patent number 10,713,769
- Issue date Jul 14, 2020
- KLA-Tencor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating high resolution images from low resolution images for se...
- Patent number 10,648,924
- Issue date May 12, 2020
- KLA-Tencor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Training a neural network for defect detection in low resolution im...
- Patent number 10,599,951
- Issue date Mar 24, 2020
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Virtual inspection systems for process window characterization
- Patent number 10,402,461
- Issue date Sep 3, 2019
- KLA-Tencor Corp.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating simulated images from input images for semiconductor app...
- Patent number 10,395,356
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerating semiconductor-related computations using learning base...
- Patent number 10,360,477
- Issue date Jul 23, 2019
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods incorporating a neural network and a forward ph...
- Patent number 10,346,740
- Issue date Jul 9, 2019
- KLA-Tencor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single image detection
- Patent number 10,186,026
- Issue date Jan 22, 2019
- KLA-Tencor Corp.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image based specimen process control
- Patent number 10,181,185
- Issue date Jan 15, 2019
- KLA-Tencor Corp.
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating simulated output for a specimen
- Patent number 10,043,261
- Issue date Aug 7, 2018
- KLA-Tencor Corp.
- Kris Bhaskar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Generating simulated images from design information
- Patent number 9,965,901
- Issue date May 8, 2018
- KLA-Tencor Corp.
- Jing Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Hybrid inspectors
- Patent number 9,916,965
- Issue date Mar 13, 2018
- KLA-Tencor Corp.
- Kris Bhaskar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for universal target based inspection and metrology
- Patent number 9,576,861
- Issue date Feb 21, 2017
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects on a wafer
- Patent number 9,355,208
- Issue date May 31, 2016
- KLA-Tencor Corp.
- Eugene Shifrin
- G01 - MEASURING TESTING
Information Patent Grant
Inspection recipe setup from reference image variation
- Patent number 9,262,821
- Issue date Feb 16, 2016
- KLA-Tencor Corp.
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Acquisition of information for a construction site
- Patent number 9,222,771
- Issue date Dec 29, 2015
- KLA-Tencor Corp.
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Grant
Generalized virtual inspector
- Patent number 9,222,895
- Issue date Dec 29, 2015
- KLA-Tencor Corp.
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Grant
Dark field inspection system with ring illumination
- Patent number 9,176,072
- Issue date Nov 3, 2015
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a characteristic of a wafer
- Patent number 8,422,010
- Issue date Apr 16, 2013
- KLA-Tencor Technologies Corp.
- Michael D. Kirk
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a characteristic of a wafer
- Patent number 8,284,394
- Issue date Oct 9, 2012
- KLA-Tencor Technologies Corp.
- Michael D. Kirk
- G01 - MEASURING TESTING
Information Patent Grant
Methods for generating a standard reference die for use in a die to...
- Patent number 8,204,296
- Issue date Jun 19, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for creating persistent data for a wafer and fo...
- Patent number 8,126,255
- Issue date Feb 28, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for generating a standard reference die for use in a die to...
- Patent number 7,796,804
- Issue date Sep 14, 2010
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for analyzing defects on a sample
- Patent number 7,345,753
- Issue date Mar 18, 2008
- KLA-Tencor Technologies Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEEP LEARNING BASED MODE SELECTION FOR INSPECTION
- Publication number 20250020598
- Publication date Jan 16, 2025
- KLA Corporation
- Rajkumar Theagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROTECTING DATA SOURCES FROM DIFFERENT ENTITIES FOR SEMICONDUCTOR Y...
- Publication number 20240169116
- Publication date May 23, 2024
- KLA Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...
- Publication number 20240013365
- Publication date Jan 11, 2024
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...
- Publication number 20230260100
- Publication date Aug 17, 2023
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
KNOWLEDGE DISTILLATION FOR SEMICONDUCTOR-BASED APPLICATIONS
- Publication number 20230136110
- Publication date May 4, 2023
- KLA Corporation
- Rajkumar Theagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS
- Publication number 20230118839
- Publication date Apr 20, 2023
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D STRUCTURE INSPECTION OR METROLOGY USING DEEP LEARNING
- Publication number 20220043357
- Publication date Feb 10, 2022
- KLA Corporation
- Scott A. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODE SELECTION AND DEFECT DETECTION TRAINING
- Publication number 20210366103
- Publication date Nov 25, 2021
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-CONTROLLER INSPECTION SYSTEM
- Publication number 20210349038
- Publication date Nov 11, 2021
- KLA Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS
- Publication number 20200327654
- Publication date Oct 15, 2020
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE LEARNING FOR DEFECT CLASSIFIER TRAINING
- Publication number 20190370955
- Publication date Dec 5, 2019
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING A NEURAL NETWORK FOR DEFECT DETECTION IN LOW RESOLUTION IM...
- Publication number 20190303717
- Publication date Oct 3, 2019
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIAGNOSTIC SYSTEMS AND METHODS FOR DEEP LEARNING MODELS CONFIGURED...
- Publication number 20180107928
- Publication date Apr 19, 2018
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS INCORPORATING A NEURAL NETWORK AND A FORWARD PH...
- Publication number 20170351952
- Publication date Dec 7, 2017
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING SIMULATED IMAGES FROM INPUT IMAGES FOR SEMICONDUCTOR APP...
- Publication number 20170345140
- Publication date Nov 30, 2017
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELERATING SEMICONDUCTOR-RELATED COMPUTATIONS USING LEARNING BASE...
- Publication number 20170200260
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE BASED SPECIMEN PROCESS CONTROL
- Publication number 20170200264
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING SIMULATED OUTPUT FOR A SPECIMEN
- Publication number 20170200265
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING HIGH RESOLUTION IMAGES FROM LOW RESOLUTION IMAGES FOR SE...
- Publication number 20170193680
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Jing Zhang
- G01 - MEASURING TESTING
Information Patent Application
HYBRID INSPECTORS
- Publication number 20170194126
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...
- Publication number 20170193400
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING SIMULATED IMAGES FROM DESIGN INFORMATION
- Publication number 20170148226
- Publication date May 25, 2017
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINGLE IMAGE DETECTION
- Publication number 20170140524
- Publication date May 18, 2017
- KLA-Tencor Corporation
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Virtual Inspection Systems for Process Window Characterization
- Publication number 20160150191
- Publication date May 26, 2016
- KLA-Tencor Corporation
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Recipe Setup from Reference Image Variation
- Publication number 20150324964
- Publication date Nov 12, 2015
- KLA-Tencor Corporation
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Detecting Repeating Defects on Semiconducto...
- Publication number 20150012900
- Publication date Jan 8, 2015
- KLA-Tencor Corporation
- Eugene Shifrin
- G01 - MEASURING TESTING
Information Patent Application
Generalized Virtual Inspector
- Publication number 20140241610
- Publication date Aug 28, 2014
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Universal Target Based Inspection and Metrology
- Publication number 20140199791
- Publication date Jul 17, 2014
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Acquisition of Information for a Construction Site
- Publication number 20130096873
- Publication date Apr 18, 2013
- KLA-Tencor Corporation
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Determining a Characteristic of a Wafer
- Publication number 20130035877
- Publication date Feb 7, 2013
- KLA-Tencor Technologies Corporation
- Michael D. Kirk
- G01 - MEASURING TESTING

Kris Bhaskar

Person

Patents Grantslast 30 patents

Mode selection and defect detection training

3D structure inspection or metrology using deep learning

Accelerated training of a machine learning based model for semicond...

Diagnostic systems and methods for deep learning models configured...

Learnable defect detection for semiconductor applications

Multi-controller inspection system

Active learning for defect classifier training

Generating high resolution images from low resolution images for se...

Training a neural network for defect detection in low resolution im...

Virtual inspection systems for process window characterization

Generating simulated images from input images for semiconductor app...

Accelerating semiconductor-related computations using learning base...

Systems and methods incorporating a neural network and a forward ph...

Single image detection

Image based specimen process control

Generating simulated output for a specimen

Generating simulated images from design information

Hybrid inspectors

Method and system for universal target based inspection and metrology

Detecting defects on a wafer

Inspection recipe setup from reference image variation

Acquisition of information for a construction site

Generalized virtual inspector

Dark field inspection system with ring illumination

Methods and systems for determining a characteristic of a wafer

Methods and systems for determining a characteristic of a wafer

Methods for generating a standard reference die for use in a die to...

Systems and methods for creating persistent data for a wafer and fo...

Methods for generating a standard reference die for use in a die to...

Apparatus and methods for analyzing defects on a sample

Patents Applicationslast 30 patents

DEEP LEARNING BASED MODE SELECTION FOR INSPECTION

PROTECTING DATA SOURCES FROM DIFFERENT ENTITIES FOR SEMICONDUCTOR Y...

UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...

UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...

KNOWLEDGE DISTILLATION FOR SEMICONDUCTOR-BASED APPLICATIONS

LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS

3D STRUCTURE INSPECTION OR METROLOGY USING DEEP LEARNING

MODE SELECTION AND DEFECT DETECTION TRAINING

MULTI-CONTROLLER INSPECTION SYSTEM

LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS

ACTIVE LEARNING FOR DEFECT CLASSIFIER TRAINING

TRAINING A NEURAL NETWORK FOR DEFECT DETECTION IN LOW RESOLUTION IM...

DIAGNOSTIC SYSTEMS AND METHODS FOR DEEP LEARNING MODELS CONFIGURED...

SYSTEMS AND METHODS INCORPORATING A NEURAL NETWORK AND A FORWARD PH...

GENERATING SIMULATED IMAGES FROM INPUT IMAGES FOR SEMICONDUCTOR APP...

ACCELERATING SEMICONDUCTOR-RELATED COMPUTATIONS USING LEARNING BASE...

IMAGE BASED SPECIMEN PROCESS CONTROL

GENERATING SIMULATED OUTPUT FOR A SPECIMEN

GENERATING HIGH RESOLUTION IMAGES FROM LOW RESOLUTION IMAGES FOR SE...

HYBRID INSPECTORS

ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...

GENERATING SIMULATED IMAGES FROM DESIGN INFORMATION

SINGLE IMAGE DETECTION

Virtual Inspection Systems for Process Window Characterization

Inspection Recipe Setup from Reference Image Variation

Methods and Systems for Detecting Repeating Defects on Semiconducto...

Generalized Virtual Inspector

Method and System for Universal Target Based Inspection and Metrology

Acquisition of Information for a Construction Site

Methods and Systems for Determining a Characteristic of a Wafer