Krishna B. Rajan

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test of 3-dimensional semiconductor memory arrays
- Patent number 7,797,594
- Issue date Sep 14, 2010
- Oracle America, Inc.
- Ishwardutt Parulkar
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing memory array at operational speed using scan
- Patent number 7,779,316
- Issue date Aug 17, 2010
- Oracle America, Inc.
- Ishwardutt Parulkar
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF TESTING MEMORY ARRAY AT OPERATIONAL SPEED USING SCAN
- Publication number 20090150729
- Publication date Jun 11, 2009
- SUN MICROSYSTEMS, INC.
- Ishwardutt Parulkar
- G06 - COMPUTING CALCULATING COUNTING