Krishna B. Rajan

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Chicago, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Increasing testability by clock transformation
- Patent number 5,625,630
- Issue date Apr 29, 1997
- Lucent Technologies Inc.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
Testing a sequential circuit
- Patent number 5,590,135
- Issue date Dec 31, 1996
- Lucent Technologies Inc.
- Miron Abramovici
- G01 - MEASURING TESTING