Krishna N. H. Sri

Person

Bangalore, IN

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for computing direct quadrature zero resultant dr...
- Patent number 12,092,693
- Issue date Sep 17, 2024
- Tektronix, Inc.
- Parjanya Adiga
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
DQ0 and inverse DQ0 transformation for three-phase inverter, motor...
- Patent number 12,088,223
- Issue date Sep 10, 2024
- Tektronix, Inc.
- U N Vasudev
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Test and measurement instrument for determining magnetic core losses
- Patent number 12,020,855
- Issue date Jun 25, 2024
- Tektronix, Inc.
- Shubha B
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument for determining maximum flux density
- Patent number 11,275,131
- Issue date Mar 15, 2022
- Tektronix, Inc.
- U N Vasudev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switching loss measurement and plot in test and measurement instrument
- Patent number 11,181,581
- Issue date Nov 23, 2021
- Tektronix, Inc.
- Krishna N H Sri
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Test and measurement instrument with a hysteresis loop mask
- Patent number 10,895,612
- Issue date Jan 19, 2021
- Tektronix, Inc.
- U N Vasudev
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic calibration of data patterns
- Patent number 9,618,965
- Issue date Apr 11, 2017
- Tektronix, Inc.
- Ganesh K. Kumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer system for automatically determining slew rate de-rating v...
- Patent number 8,670,947
- Issue date Mar 11, 2014
- Tektronix, Inc.
- G. R. N. Prasanth
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POW...
- Publication number 20240353470
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Niranjan R. Hegde
- G01 - MEASURING TESTING
Information Patent Application
DEFECT ANALYSIS OF ELECTRIC MOTORS USING REFERENCE FRAMES (DQZ COMP...
- Publication number 20240345166
- Publication date Oct 17, 2024
- Tektronix, Inc.
- Krishna N H Sri
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO CHARACTERIZE THE PERFORMANCE OF ELECTRICAL STO...
- Publication number 20240142530
- Publication date May 2, 2024
- Tektronix, Inc.
- K T Anurag
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING OUTPUT CHARGE OF WIDE BANDGAP...
- Publication number 20240044968
- Publication date Feb 8, 2024
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC VERTICAL SIGNAL CALIBRATION IN A TEST AND MEASUREMENT INSTR...
- Publication number 20240036143
- Publication date Feb 1, 2024
- Tektronix, Inc.
- Shubha B
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS
- Publication number 20240027513
- Publication date Jan 25, 2024
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING POWER SUPPLY INDUCED JITTER
- Publication number 20230251699
- Publication date Aug 10, 2023
- Tektronix, Inc.
- Madhusudan Acharya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REVERSE RECOVERY MEASUREMENTS AND PLOTS
- Publication number 20230133047
- Publication date May 4, 2023
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE WIDE BANDGAP DOUBLE PULSE TESTING METHODOLOGY
- Publication number 20230133743
- Publication date May 4, 2023
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR COMPUTING DIRECT QUADRATURE ZERO RESULTANT DR...
- Publication number 20220413051
- Publication date Dec 29, 2022
- Tektronix, Inc.
- Parjanya Adiga
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT FOR DETERMINING MAGNETIC CORE LOSSES
- Publication number 20210358685
- Publication date Nov 18, 2021
- Tektronix, Inc.
- Shubha B
- G01 - MEASURING TESTING
Information Patent Application
DQ0 AND INVERSE DQ0 TRANSFORMATION FOR THREE-PHASE INVERTER, MOTOR...
- Publication number 20210013818
- Publication date Jan 14, 2021
- Tektronix, Inc.
- U N Vasudev
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Test and Measurement Instrument with a Hysteresis Loop Mask
- Publication number 20200116805
- Publication date Apr 16, 2020
- Tektronix, Inc.
- U N Vasudev
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC CALIBRATION OF DATA PATTERNS
- Publication number 20160334833
- Publication date Nov 17, 2016
- Tektronix, Inc.
- Ganesh K. Kumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SWITCHING LOSS MEASUREMENT AND PLOT IN TEST AND MEASUREMENT INSTRUMENT
- Publication number 20150032393
- Publication date Jan 29, 2015
- Tektronix, Inc.
- KRISHNA N H SRI
- G01 - MEASURING TESTING
Information Patent Application
Method and System to Measure and Represent the Measured Value of a...
- Publication number 20110119688
- Publication date May 19, 2011
- Tektronix, Inc.
- G R N Prasanth
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC INDUCTANCE MEASUREMENT OF ELECTRIC MOTOR
- Publication number 20080297170
- Publication date Dec 4, 2008
- Tektronix, Inc.
- Krishna N. H. Sri
- G01 - MEASURING TESTING

Krishna N. H. Sri

Person

Patents Grantslast 30 patents

System and method for computing direct quadrature zero resultant dr...

DQ0 and inverse DQ0 transformation for three-phase inverter, motor...

Test and measurement instrument for determining magnetic core losses

Test and measurement instrument for determining maximum flux density

Switching loss measurement and plot in test and measurement instrument

Test and measurement instrument with a hysteresis loop mask

Dynamic calibration of data patterns

Computer system for automatically determining slew rate de-rating v...

Patents Applicationslast 30 patents

SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POW...

DEFECT ANALYSIS OF ELECTRIC MOTORS USING REFERENCE FRAMES (DQZ COMP...

SYSTEM AND METHOD TO CHARACTERIZE THE PERFORMANCE OF ELECTRICAL STO...

METHOD AND APPARATUS FOR DETERMINING OUTPUT CHARGE OF WIDE BANDGAP...

DYNAMIC VERTICAL SIGNAL CALIBRATION IN A TEST AND MEASUREMENT INSTR...

AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS

METHOD AND APPARATUS FOR MEASURING POWER SUPPLY INDUCED JITTER

REVERSE RECOVERY MEASUREMENTS AND PLOTS

FLEXIBLE WIDE BANDGAP DOUBLE PULSE TESTING METHODOLOGY

SYSTEM AND METHOD FOR COMPUTING DIRECT QUADRATURE ZERO RESULTANT DR...

TEST AND MEASUREMENT INSTRUMENT FOR DETERMINING MAGNETIC CORE LOSSES

DQ0 AND INVERSE DQ0 TRANSFORMATION FOR THREE-PHASE INVERTER, MOTOR...

Test and Measurement Instrument with a Hysteresis Loop Mask

DYNAMIC CALIBRATION OF DATA PATTERNS

SWITCHING LOSS MEASUREMENT AND PLOT IN TEST AND MEASUREMENT INSTRUMENT

Method and System to Measure and Represent the Measured Value of a...

DYNAMIC INDUCTANCE MEASUREMENT OF ELECTRIC MOTOR