Krishnendu Mondal

Person

Bangalore, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 11,295,829
- Issue date Apr 5, 2022
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,971,243
- Issue date Apr 6, 2021
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,692,584
- Issue date Jun 23, 2020
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,553,302
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Failure analysis and repair register sharing for memory BIST
- Patent number 10,014,074
- Issue date Jul 3, 2018
- GLOBALFOUNDRIES Inc.
- Krishnendu Mondal
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in-self-test (BIST) engine configured to store a per pattern...
- Patent number 9,881,694
- Issue date Jan 30, 2018
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable counter to control memory built in self-test
- Patent number 9,859,019
- Issue date Jan 2, 2018
- International Business Machines Corporation
- Deepak I. Hanagandi
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in-self-test (BIST) test time reduction
- Patent number 9,773,570
- Issue date Sep 26, 2017
- International Business Machines Corporation
- Kevin W. Gorman
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) circuit and associated BIST method for em...
- Patent number 9,761,329
- Issue date Sep 12, 2017
- GLOBALFOUNDRIES Inc.
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) circuit and associated BIST method for em...
- Patent number 9,715,942
- Issue date Jul 25, 2017
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Decreasing power supply demand during BIST initializations
- Patent number 8,918,690
- Issue date Dec 23, 2014
- International Business Machines Corporation
- Deepak I. Hanagandi
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method of reducing test time via address aware BIST circ...
- Patent number 8,914,688
- Issue date Dec 16, 2014
- International Business Machines Corporation
- George M. Belansek
- G11 - INFORMATION STORAGE
Information Patent Grant
Stacked chip module with integrated circuit chips having integratab...
- Patent number 8,872,322
- Issue date Oct 28, 2014
- International Business Machines Corporation
- Kevin W. Gorman
- G11 - INFORMATION STORAGE
Information Patent Grant
Stacked chip module with integrated circuit chips having integratab...
- Patent number 8,853,847
- Issue date Oct 7, 2014
- International Business Machines Corporation
- Kevin W. Gorman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20200075119
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20190378587
- Publication date Dec 12, 2019
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20180061509
- Publication date Mar 1, 2018
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20180053566
- Publication date Feb 22, 2018
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
FAILURE ANALYSIS AND REPAIR REGISTER SHARING FOR MEMORY BIST
- Publication number 20170309349
- Publication date Oct 26, 2017
- GLOBALFOUNDRIES INC.
- Krishnendu MONDAL
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) CIRCUIT AND ASSOCIATED BIST METHOD FOR EM...
- Publication number 20170110205
- Publication date Apr 20, 2017
- GLOBALFOUNDRIES INC.
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE
- Publication number 20170018313
- Publication date Jan 19, 2017
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) CIRCUIT AND ASSOCIATED BIST METHOD FOR EM...
- Publication number 20160365156
- Publication date Dec 15, 2016
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN-SELF-TEST (BIST) TEST TIME REDUCTION
- Publication number 20140258797
- Publication date Sep 11, 2014
- International Business Machines Corporation
- Kevin W. Gorman
- G11 - INFORMATION STORAGE
Information Patent Application
DECREASING POWER SUPPLY DEMAND DURING BIST INITIALIZATIONS
- Publication number 20140189448
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Deepak I. Hanagandi
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD OF REDUCING TEST TIME VIA ADDRESS AWARE BIST CIRC...
- Publication number 20140149810
- Publication date May 29, 2014
- International Business Machines Corporation
- George M. Belansek
- G11 - INFORMATION STORAGE
Information Patent Application
STACKED CHIP MODULE WITH INTEGRATED CIRCUIT CHIPS HAVING INTEGRATAB...
- Publication number 20140110711
- Publication date Apr 24, 2014
- International Business Machines Corporation
- Kevin W. Gorman
- G01 - MEASURING TESTING
Information Patent Application
STACKED CHIP MODULE WITH INTEGRATED CIRCUIT CHIPS HAVING INTEGRATAB...
- Publication number 20140110710
- Publication date Apr 24, 2014
- International Business Machines Corporation
- Kevin W. Gorman
- G01 - MEASURING TESTING

Krishnendu Mondal

Person

Patents Grantslast 30 patents

Built-in self-test (BIST) engine configured to store a per pattern...

Built-in self-test (BIST) engine configured to store a per pattern...

Built-in self-test (BIST) engine configured to store a per pattern...

Built-in self-test (BIST) engine configured to store a per pattern...

Failure analysis and repair register sharing for memory BIST

Built-in-self-test (BIST) engine configured to store a per pattern...

Programmable counter to control memory built in self-test

Built-in-self-test (BIST) test time reduction

Built-in self-test (BIST) circuit and associated BIST method for em...

Built-in self-test (BIST) circuit and associated BIST method for em...

Decreasing power supply demand during BIST initializations

System and method of reducing test time via address aware BIST circ...

Stacked chip module with integrated circuit chips having integratab...

Stacked chip module with integrated circuit chips having integratab...

Patents Applicationslast 30 patents

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

FAILURE ANALYSIS AND REPAIR REGISTER SHARING FOR MEMORY BIST

BUILT-IN SELF-TEST (BIST) CIRCUIT AND ASSOCIATED BIST METHOD FOR EM...

BUILT-IN SELF-TEST (BIST) ENGINE

BUILT-IN SELF-TEST (BIST) CIRCUIT AND ASSOCIATED BIST METHOD FOR EM...

BUILT-IN-SELF-TEST (BIST) TEST TIME REDUCTION

DECREASING POWER SUPPLY DEMAND DURING BIST INITIALIZATIONS

SYSTEM AND METHOD OF REDUCING TEST TIME VIA ADDRESS AWARE BIST CIRC...

STACKED CHIP MODULE WITH INTEGRATED CIRCUIT CHIPS HAVING INTEGRATAB...

STACKED CHIP MODULE WITH INTEGRATED CIRCUIT CHIPS HAVING INTEGRATAB...