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Kristan K. Wiseley
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Folsom, CA, US
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last 30 patents
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Patent Grant
Techniques to enable integrated circuit debug across low power states
Patent number
11,933,843
Issue date
Mar 19, 2024
Intel Corporation
Keith A. Jones
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
TECHNIQUES TO ENABLE INTEGRATED CIRCUIT DEBUG ACROSS LOW POWER STATES
Publication number
20220018901
Publication date
Jan 20, 2022
Keith A. Jones
G01 - MEASURING TESTING