Olney, MD, US
Information
Patent Grant
The United States of America as represented by the Secretary of the Army
Leonid A. Beresnev
G02 - OPTICS
Information
Patent Grant
The United States of America as represented by the Secretary of the Army
Leonid A. Beresnev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
The United States of America as represented by the Secretary of the Army
Shuowen Hu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
The United States of America as represented by the Secretary of the Army
Nathaniel J. Short
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
The United States of America as represented by the Secretary of the Army
Gorden W. Videen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
The United States of America as represented by the Secretary of the Army
Kristan Peter Gurton
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by the Secretary of the Army
Kristan Peter Gurton
F41 - WEAPONS
Information
Patent Grant
United States of America as represented by the Secretary of the Army
Kristan P. Gurton
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by the Secretary of the Army
Steven Clyde Hill
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by the Secretary of the Navy
Kristan P. Gurton
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by the Secretary of the Army
Kristan P. Gurton
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by the Secretary of the Army
Kristan P. Gurton
G01 - MEASURING TESTING
Information
Patent Application
U.S. Army DEVCOM, Army Research Laboratory
Leonid A. Beresnev
G02 - OPTICS
Information
Patent Application
U.S. Army Research Laboratory
Leonid A. Beresnev
G02 - OPTICS
Information
Patent Application
U.S. Army Research Laboratory
Shuowen Hu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
U.S. ARMY RESEARCH LABORATORY ATTN: RDRL-LOC-I
Nathaniel J. Short
G01 - MEASURING TESTING
Information
Patent Application
U.S. ARMY RESEARCH LABORATORY ATTN: RDRL-LOC-I
Gorden W. Videen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
U.S. ARMY RESEARCH LABORATORY ATTN: RDRL-LOC-I
KRISTAN PETER GURTON
G01 - MEASURING TESTING
Information
Patent Application
U.S. Government as represented by the Secretary of the Army
KRISTAN PETER GURTON
G01 - MEASURING TESTING
Information
Patent Application
U.S. Army Research Laboratory
Steven Clyde Hill
G01 - MEASURING TESTING
Information
Patent Application
Kristan P. Gurton
G01 - MEASURING TESTING
