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Kristann L. Moody
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Barrington, NH, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for magnetic field sensors with self-test
Patent number
11,585,868
Issue date
Feb 21, 2023
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for magnetic field sensors with self-test
Patent number
10,782,363
Issue date
Sep 22, 2020
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Enabling testing of an integrated circuit at a single temperature
Patent number
10,120,017
Issue date
Nov 6, 2018
ALLEGRO MICROSYSTEMS, LLC
Kristann L. Moody
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for magnetic field sensors with self-test
Patent number
9,851,416
Issue date
Dec 26, 2017
Allegro Microsystems, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Grant
Centering a signal within the dynamic range of a peak detecting pro...
Patent number
6,232,768
Issue date
May 15, 2001
Allegro Microsystems Inc.
Kristann L. Moody
G01 - MEASURING TESTING
Information
Patent Grant
Detection of passing magnetic articles with a peak referenced thres...
Patent number
6,091,239
Issue date
Jul 18, 2000
Allegro Microsystems, Inc.
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Grant
Tracking and holding in a DAC the peaks in the field-proportional v...
Patent number
5,729,130
Issue date
Mar 17, 1998
Kristann L. Moody
G01 - MEASURING TESTING
Information
Patent Grant
Detector of passing magnetic articles with automatic gain control
Patent number
5,694,038
Issue date
Dec 2, 1997
Allegro Microsystems, Inc.
Kristann L. Moody
G01 - MEASURING TESTING
Information
Patent Grant
Detection of passing magnetic articles while periodically adapting...
Patent number
5,650,719
Issue date
Jul 22, 1997
Allegro Microsystems, Inc.
Kristann L. Moody
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR MAGNETIC FIELD SENSORS WITH SELF-TEST
Publication number
20200379061
Publication date
Dec 3, 2020
ALLEGRO MICROSYSTEMS, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Magnetic Field Sensors With Self-Test
Publication number
20180088184
Publication date
Mar 29, 2018
Allegro Microsystems, LLC
P. Karl Scheller
G01 - MEASURING TESTING
Information
Patent Application
ENABLING TESTING OF AN INTEGRATED CIRCUIT AT A SINGLE TEMPERATURE
Publication number
20180017615
Publication date
Jan 18, 2018
Allegro Microsystems, LLC
Kristann L. Moody
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Magnetic Field Sensors with Self-Test
Publication number
20160025820
Publication date
Jan 28, 2016
Allegro Microsystems, LLC
P. Karl Scheller
G01 - MEASURING TESTING