Krister Svensson

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Gothenburg, SE

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Patents Grantslast 30 patents

Information Patent Grant
Iterative feedback tuning in a scanning probe microscope
- Patent number 8,250,667
- Issue date Aug 21, 2012
- Nanofactory Instruments AB
- Krister Svensson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measurement device for electron microscope
- Patent number 7,363,802
- Issue date Apr 29, 2008
- Nanofactory Instruments AB
- Håkan Olin
- G01 - MEASURING TESTING
Information Patent Grant
Micropositioning device
- Patent number 6,917,140
- Issue date Jul 12, 2005
- Nanofactory Instruments AB
- Håkan Olin
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Patents Applicationslast 30 patents

Information Patent Application
ITERATIVE FEEDBACK TUNING IN A SCANNING PROBE MICROSCOPE
- Publication number 20110016592
- Publication date Jan 20, 2011
- NANOFACTORY INSTRUMENTS AB
- Krister Svensson
- G01 - MEASURING TESTING
Information Patent Application
SAFE MOTION
- Publication number 20100230608
- Publication date Sep 16, 2010
- NANOFACTORY INSTRUMENTS AB
- Paul Bengtsson
- G01 - MEASURING TESTING
Information Patent Application
Measurement device for electron microscope
- Publication number 20050103996
- Publication date May 19, 2005
- Hakan Olin
- G01 - MEASURING TESTING
Information Patent Application
Device for reducing the impact of distortions in a microscope
- Publication number 20040195523
- Publication date Oct 7, 2004
- Hakan Olin
- B82 - NANO-TECHNOLOGY
Information Patent Application
Micropositioning device
- Publication number 20040051424
- Publication date Mar 18, 2004
- Hakan Olin
- G02 - OPTICS
Information Patent Application
Instrument and method for combined surface topography and spectrosc...
- Publication number 20030010911
- Publication date Jan 16, 2003
- Richard Edward Palmer
- B82 - NANO-TECHNOLOGY