Kristof J.P. Jacobs

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Duffel, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method of detecting manufacturing defects by thermal stimulation
- Patent number 10,777,471
- Issue date Sep 15, 2020
- Imec VZW
- Kristof J. P. Jacobs
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Lock-in Averaging for Semiconductor Diagnostics
- Publication number 20250155381
- Publication date May 15, 2025
- IMEC vzw
- Kristof J.P. Jacobs
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING MANUFACTURING DEFECTS BY THERMAL STIMULATION
- Publication number 20200075431
- Publication date Mar 5, 2020
- IMEC vzw
- Kristof J.P. Jacobs
- H01 - BASIC ELECTRIC ELEMENTS