Kristof Paredis

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Leuven, BE

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Patents Grantslast 30 patents

Information Patent Grant
Device for measuring surface characteristics of a material
- Patent number 11,125,805
- Issue date Sep 21, 2021
- Imec VZW
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Grant
Method and tip substrate for scanning probe microscopy
- Patent number 11,112,427
- Issue date Sep 7, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the shape of a sample tip for atom probe tom...
- Patent number 10,746,759
- Issue date Aug 18, 2020
- Imec VZW
- Kristof Paredis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for transmission electron microscopy
- Patent number 10,541,108
- Issue date Jan 21, 2020
- Imec VZW
- Umberto Celano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for two dimensional active carrier profiling of s...
- Patent number 10,495,666
- Issue date Dec 3, 2019
- Imec VZW
- Kristof Paredis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND TIP SUBSTRATE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210116476
- Publication date Apr 22, 2021
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING SURFACE CHARACTERISTICS OF A MATERIAL
- Publication number 20200033395
- Publication date Jan 30, 2020
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE SHAPE OF A SAMPLE TIP FOR ATOM PROBE TOM...
- Publication number 20190277881
- Publication date Sep 12, 2019
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TWO DIMENSIONAL ACTIVE CARRIER PROFILING OF S...
- Publication number 20190025341
- Publication date Jan 24, 2019
- IMEC vzw
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY
- Publication number 20180240642
- Publication date Aug 23, 2018
- IMEC vzw
- Umberto Celano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPY
- Publication number 20150226766
- Publication date Aug 13, 2015
- Bruker Nano, Inc.
- Kristof Paredis
- G01 - MEASURING TESTING