Kristopher Kopel

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatuses and methods for dynamic column select swapping
- Patent number 12,354,694
- Issue date Jul 8, 2025
- Micron echnology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
On-die testing for a memory device
- Patent number 12,211,571
- Issue date Jan 28, 2025
- Micron Technology, Inc.
- David W. Overgaard
- G11 - INFORMATION STORAGE
Information Patent Grant
Salvaging bad blocks in a memory device
- Patent number 12,007,860
- Issue date Jun 11, 2024
- Micron Technology, Inc.
- Sri Rama Namala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Salvaging bad blocks in a memory device
- Patent number 11,537,484
- Issue date Dec 27, 2022
- Micron Technology, Inc.
- Sri Rama Namala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for running test and redundancy analysis in parallel
- Patent number 8,086,916
- Issue date Dec 27, 2011
- Micron Technology, Inc.
- Kristopher Kopel
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ON-DIE TESTING FOR A MEMORY DEVICE
- Publication number 20250218526
- Publication date Jul 3, 2025
- Micron Technology, Inc.
- David W. Overgaard
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR DYNAMIC COLUMN SELECT SWAPPING
- Publication number 20230290428
- Publication date Sep 14, 2023
- Micron Technology, Inc.
- YOSHINORI FUJIWARA
- G11 - INFORMATION STORAGE
Information Patent Application
SALVAGING BAD BLOCKS IN A MEMORY DEVICE
- Publication number 20230111510
- Publication date Apr 13, 2023
- Micron Technology, Inc.
- Sri Rama Namala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-DIE TESTING FOR A MEMORY DEVICE
- Publication number 20220108761
- Publication date Apr 7, 2022
- Micron Technology, Inc.
- David W. Overgaard
- G11 - INFORMATION STORAGE
Information Patent Application
SALVAGING BAD BLOCKS IN A MEMORY DEVICE
- Publication number 20220066894
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Sri Rama Namala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR RUNNING TEST AND REDUNDANCY ANALYSIS IN PARALLEL
- Publication number 20090265588
- Publication date Oct 22, 2009
- Micron Technology, Inc.
- Kristopher Kopel
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR RUNNING TEST AND REDUNDANCY ANALYSIS IN PARALLEL
- Publication number 20080270854
- Publication date Oct 30, 2008
- Micron Technology, Inc.
- Kristopher Kopel
- G11 - INFORMATION STORAGE

Kristopher Kopel

Person

Patents Grantslast 30 patents

Apparatuses and methods for dynamic column select swapping

On-die testing for a memory device

Salvaging bad blocks in a memory device

Salvaging bad blocks in a memory device

System and method for running test and redundancy analysis in parallel

Patents Applicationslast 30 patents

ON-DIE TESTING FOR A MEMORY DEVICE

APPARATUSES AND METHODS FOR DYNAMIC COLUMN SELECT SWAPPING

SALVAGING BAD BLOCKS IN A MEMORY DEVICE

ON-DIE TESTING FOR A MEMORY DEVICE

SALVAGING BAD BLOCKS IN A MEMORY DEVICE

SYSTEM AND METHOD FOR RUNNING TEST AND REDUNDANCY ANALYSIS IN PARALLEL

SYSTEM AND METHOD FOR RUNNING TEST AND REDUNDANCY ANALYSIS IN PARALLEL