Kriteshwar K. Kohli

Person

Fishkill, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Natural language processing with missing tokens in a corpus
- Patent number 11,687,723
- Issue date Jun 27, 2023
- International Business Machines Corporation
- Raj Nagesh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Demonstrating textual dissimilarity in response to apparent or asse...
- Patent number 11,321,526
- Issue date May 3, 2022
- International Business Machines Corporation
- Rob Bean
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Augmented reality field of view based on sensed user data
- Patent number 11,176,753
- Issue date Nov 16, 2021
- International Business Machines Corporation
- Divya Kannan Chakravarthi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predictive navigation system
- Patent number 11,047,705
- Issue date Jun 29, 2021
- International Business Machines Corporation
- Divya Kannan Chakravarthi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Creating knowledge base for optical proximity correction to reduce...
- Patent number 10,386,714
- Issue date Aug 20, 2019
- GLOBALFOUNDRIES Inc.
- Kriteshwar K. Kohli
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Modified tungsten silicon
- Patent number 10,192,822
- Issue date Jan 29, 2019
- GLOBALFOUNDRIES Inc.
- Domingo A. Ferrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitance monitoring using x-ray diffraction
- Patent number 10,008,421
- Issue date Jun 26, 2018
- International Business Machines Corporation
- Donghun Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-destructive dielectric layer thickness and dopant measuring method
- Patent number 9,892,979
- Issue date Feb 13, 2018
- GLOBALFOUNDRIES Inc.
- Kriteshwar K. Kohli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitance monitoring using X-ray diffraction
- Patent number 9,870,960
- Issue date Jan 16, 2018
- International Business Machines Corporation
- Donghun Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluating semiconductor wafers for pitch walking and/or epitaxial...
- Patent number 9,201,027
- Issue date Dec 1, 2015
- GLOBALFOUNDRIES Inc.
- Kriteshwar K. Kohli
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TWO TIER DISTRIBUTION OPTIMIZATION USING A TIME SPACE MODEL
- Publication number 20220398532
- Publication date Dec 15, 2022
- International Business Machines Corporation
- Hua Ni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUGMENTED REALITY FIELD OF VIEW BASED ON SENSED USER DATA
- Publication number 20210343085
- Publication date Nov 4, 2021
- International Business Machines Corporation
- Divya Kannan CHAKRAVARTHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEMONSTRATING TEXTUAL DISSIMILARITY IN RESPONSE TO APPARENT OR ASSE...
- Publication number 20210294973
- Publication date Sep 23, 2021
- International Business Machines Corporation
- Rob Bean
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NATURAL LANGUAGE PROCESSING WITH MISSING TOKENS IN A CORPUS
- Publication number 20210294979
- Publication date Sep 23, 2021
- International Business Machines Corporation
- Raj Nagesh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PREDICTIVE NAVIGATION SYSTEM
- Publication number 20210010821
- Publication date Jan 14, 2021
- International Business Machines Corporation
- DIVYA KANNAN CHAKRAVARTHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CREATING KNOWLEDGE BASE FOR OPTICAL PROXIMITY CORRECTION TO REDUCE...
- Publication number 20180196340
- Publication date Jul 12, 2018
- GLOBALFOUNDRIES INC.
- Kriteshwar K. Kohli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CAPACITANCE MONITORING USING X-RAY DIFFRACTION
- Publication number 20180096904
- Publication date Apr 5, 2018
- International Business Machines Corporation
- Donghun Kang
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE DIELECTRIC LAYER THICKNESS AND DOPANT MEASURING METHOD
- Publication number 20160372385
- Publication date Dec 22, 2016
- GLOBALFOUNDRIES INC.
- Kriteshwar K. Kohli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODIFIED TUNGSTEN SILICON
- Publication number 20160240478
- Publication date Aug 18, 2016
- GLOBALFOUNDRIES Inc.
- Domingo A. Ferrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITANCE MONITORING USING X-RAY DIFFRACTION
- Publication number 20160178679
- Publication date Jun 23, 2016
- International Business Machines Corporation
- Donghun Kang
- G01 - MEASURING TESTING
Information Patent Application
EVALUATING SEMICONDUCTOR WAFERS FOR PITCH WALKING AND/OR EPITAXIAL...
- Publication number 20150233844
- Publication date Aug 20, 2015
- International Business Machines Corporation
- Kriteshwar K. Kohli
- G01 - MEASURING TESTING

Kriteshwar K. Kohli

Person

Patents Grantslast 30 patents

Natural language processing with missing tokens in a corpus

Demonstrating textual dissimilarity in response to apparent or asse...

Augmented reality field of view based on sensed user data

Predictive navigation system

Creating knowledge base for optical proximity correction to reduce...

Modified tungsten silicon

Capacitance monitoring using x-ray diffraction

Non-destructive dielectric layer thickness and dopant measuring method

Capacitance monitoring using X-ray diffraction

Evaluating semiconductor wafers for pitch walking and/or epitaxial...

Patents Applicationslast 30 patents

TWO TIER DISTRIBUTION OPTIMIZATION USING A TIME SPACE MODEL

AUGMENTED REALITY FIELD OF VIEW BASED ON SENSED USER DATA

DEMONSTRATING TEXTUAL DISSIMILARITY IN RESPONSE TO APPARENT OR ASSE...

NATURAL LANGUAGE PROCESSING WITH MISSING TOKENS IN A CORPUS

PREDICTIVE NAVIGATION SYSTEM

CREATING KNOWLEDGE BASE FOR OPTICAL PROXIMITY CORRECTION TO REDUCE...

CAPACITANCE MONITORING USING X-RAY DIFFRACTION

NON-DESTRUCTIVE DIELECTRIC LAYER THICKNESS AND DOPANT MEASURING METHOD

MODIFIED TUNGSTEN SILICON

CAPACITANCE MONITORING USING X-RAY DIFFRACTION

EVALUATING SEMICONDUCTOR WAFERS FOR PITCH WALKING AND/OR EPITAXIAL...