Krzysztof Dabrowiecki

Follow

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for implementing electrical connectivity for...
- Patent number 8,664,969
- Issue date Mar 4, 2014
- Probelogic, Inc.
- Krzysztof Dabrowiecki
- G01 - MEASURING TESTING
Information Patent Grant
Bundled probe apparatus for multiple terminal contacting
- Patent number 7,064,564
- Issue date Jun 20, 2006
- Antares conTech, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Assembly structure for making integrated circuit chip probe cards
- Patent number 6,204,674
- Issue date Mar 20, 2001
- Probe Technology, Inc.
- Krzysztof Dabrowiecki
- G01 - MEASURING TESTING
Information Patent Grant
Assembly structure for making integrated circuit chip probe cards
- Patent number 5,884,395
- Issue date Mar 23, 1999
- Probe Technology
- Krzysztof Dabrowiecki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR IMPLEMENTING PROBES FOR ELECTRONIC CIRCUIT...
- Publication number 20120319710
- Publication date Dec 20, 2012
- ProbeLogic, Inc.
- Krzysztof DABROWIECKI
- G01 - MEASURING TESTING
Information Patent Application
Bundled probe apparatus for multiple terminal contacting
- Publication number 20020101248
- Publication date Aug 1, 2002
- January Kister
- G01 - MEASURING TESTING