Krzysztof Iniewski

Person

Coquitlam, CA

People

Patents Grantslast 30 patents

Information Patent Grant
P-type CZT radiation detector for high flux applications
- Patent number 12,094,988
- Issue date Sep 17, 2024
- Redlen Technologies, Inc.
- James Balcom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photon counting computed tomography detector with improved count ra...
- Patent number 11,835,666
- Issue date Dec 5, 2023
- Redlen Technologies, Inc.
- James Balcom
- G01 - MEASURING TESTING
Information Patent Grant
High-performance radiation detectors and methods of fabricating the...
- Patent number 11,733,408
- Issue date Aug 22, 2023
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compton scattering correction methods for pixellated radiation dete...
- Patent number 11,701,065
- Issue date Jul 18, 2023
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
Charge sharing correction methods for sub-pixellated radiation dete...
- Patent number 11,372,120
- Issue date Jun 28, 2022
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
Calibration methods for improving uniformity in X-ray photon counti...
- Patent number 11,344,266
- Issue date May 31, 2022
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
Compensation for charge sharing between detector pixels in a pixila...
- Patent number 11,246,547
- Issue date Feb 15, 2022
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Methods of calibrating semiconductor radiation detectors using K-ed...
- Patent number 11,169,286
- Issue date Nov 9, 2021
- Redlen Technologies, Inc.
- Elmaddin Guliyev
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for X-ray diffraction virtual spectroscopy
- Patent number 11,156,568
- Issue date Oct 26, 2021
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
Time signatures and pattern matching in x-ray photon counting detec...
- Patent number 11,105,938
- Issue date Aug 31, 2021
- Redlen Technologies, Inc.
- Bernard Harris
- G01 - MEASURING TESTING
Information Patent Grant
Four-side buttable radiation detector unit and method of making the...
- Patent number 11,067,707
- Issue date Jul 20, 2021
- Redlen Technologies, Inc.
- Robert Crestani
- G01 - MEASURING TESTING
Information Patent Grant
Charge sharing correction methods for pixelated radiation detector...
- Patent number 10,928,527
- Issue date Feb 23, 2021
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
MOS varactor structure with engineered voltage control range
- Patent number 6,407,412
- Issue date Jun 18, 2002
- PMC-Sierra Inc.
- Krzysztof Iniewski
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DIRECT ATTACH RADIATION DETECTOR STRUCTURES HAVING REDUCED CROSS-TALK
- Publication number 20240418877
- Publication date Dec 19, 2024
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
DIRECT ATTACH RADIATION DETECTOR STRUCTURES INCLUDING PIXELATED SEN...
- Publication number 20240377544
- Publication date Nov 14, 2024
- REDLEN TECHNOLOGIES, INC.
- Glenn BINDLEY
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTORS HAVING IMPROVED OUTPUT COUNT RATE EQUALIZATION...
- Publication number 20240302549
- Publication date Sep 12, 2024
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR MODULE INCLUDING APPLICATION SPECIFIC INTEGRATED...
- Publication number 20240230932
- Publication date Jul 11, 2024
- REDLEN TECHNOLOGIES, INC.
- Michael AYUKAWA
- G01 - MEASURING TESTING
Information Patent Application
DIRECT ATTACH RADIATION DETECTOR STRUCTURES INCLUDING A CARRIER BOA...
- Publication number 20240219589
- Publication date Jul 4, 2024
- REDLEN TECHNOLOGIES, INC.
- Michael AYUKAWA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR HAVING IMPROVED EQUALIZATION OF PIXEL RESPONSE
- Publication number 20240159924
- Publication date May 16, 2024
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR MODULE INCLUDING APPLICATION SPECIFIC INTEGRATED...
- Publication number 20240134071
- Publication date Apr 25, 2024
- REDLEN TECHNOLOGIES, INC.
- Michael AYUKAWA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR MODULE WITH LOCAL PROCESSING UNIT
- Publication number 20240085577
- Publication date Mar 14, 2024
- REDLEN TECHNOLOGIES, INC.
- Michael AYUKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR K-EDGE-BASED X-RAY IMAGING HAVING IMPROVED...
- Publication number 20230400422
- Publication date Dec 14, 2023
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING BONE MASS DENSITY USING ENERGY DI...
- Publication number 20230293131
- Publication date Sep 21, 2023
- REDLEN TECHNOLOGIES, INC.
- Glenn BINDLEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIATION DETECTOR ARRAYS HAVING INCREASED EFFICIENCY AND METHODS O...
- Publication number 20230280486
- Publication date Sep 7, 2023
- REDLEN TECHNOLOGIES, INC.
- Xavier DEFAY
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR UNIT WITH THREE-SIDE BUTTABLE READ-OUT INTEGRATE...
- Publication number 20230243985
- Publication date Aug 3, 2023
- REDLEN TECHNOLOGIES, INC.
- Glenn BINDLEY
- G01 - MEASURING TESTING
Information Patent Application
HIGH-PERFORMANCE RADIATION DETECTORS AND METHODS OF FABRICATING THE...
- Publication number 20210333420
- Publication date Oct 28, 2021
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION METHODS FOR IMPROVING UNIFORMITY IN X-RAY PHOTON COUNTI...
- Publication number 20210121143
- Publication date Apr 29, 2021
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CHARGE SHARING CORRECTION METHODS FOR SUB-PIXELLATED RADIATION DETE...
- Publication number 20210063589
- Publication date Mar 4, 2021
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION FOR CHARGE SHARING BETWEEN DETECTOR PIXELS IN A PIXILA...
- Publication number 20210022695
- Publication date Jan 28, 2021
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
TIME SIGNATURES AND PATTERN MATCHING IN X-RAY PHOTON COUNTING DETEC...
- Publication number 20200393576
- Publication date Dec 17, 2020
- REDLEN TECHNOLOGIES, INC.
- Bernard HARRIS
- G01 - MEASURING TESTING
Information Patent Application
COMPTON SCATTERING CORRECTION METHODS FOR PIXELLATED RADIATION DETE...
- Publication number 20200367839
- Publication date Nov 26, 2020
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR X-RAY DIFFRACTION VIRTUAL SPECTROSCOPY
- Publication number 20200326290
- Publication date Oct 15, 2020
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
CHARGE SHARING CORRECTION METHODS FOR PIXELLATED RADIATION DETECTOR...
- Publication number 20200150297
- Publication date May 14, 2020
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF CALIBRATING SEMICONDUCTOR RADIATION DETECTORS USING K-ED...
- Publication number 20190383956
- Publication date Dec 19, 2019
- REDLEN TECHNOLOGIES, INC.
- Elmaddin GULIYEV
- G01 - MEASURING TESTING

Krzysztof Iniewski

Person

Patents Grantslast 30 patents

P-type CZT radiation detector for high flux applications

Photon counting computed tomography detector with improved count ra...

High-performance radiation detectors and methods of fabricating the...

Compton scattering correction methods for pixellated radiation dete...

Charge sharing correction methods for sub-pixellated radiation dete...

Calibration methods for improving uniformity in X-ray photon counti...

Compensation for charge sharing between detector pixels in a pixila...

Methods of calibrating semiconductor radiation detectors using K-ed...

Systems and methods for X-ray diffraction virtual spectroscopy

Time signatures and pattern matching in x-ray photon counting detec...

Four-side buttable radiation detector unit and method of making the...

Charge sharing correction methods for pixelated radiation detector...

MOS varactor structure with engineered voltage control range

Patents Applicationslast 30 patents

DIRECT ATTACH RADIATION DETECTOR STRUCTURES HAVING REDUCED CROSS-TALK

DIRECT ATTACH RADIATION DETECTOR STRUCTURES INCLUDING PIXELATED SEN...

RADIATION DETECTORS HAVING IMPROVED OUTPUT COUNT RATE EQUALIZATION...

RADIATION DETECTOR MODULE INCLUDING APPLICATION SPECIFIC INTEGRATED...

DIRECT ATTACH RADIATION DETECTOR STRUCTURES INCLUDING A CARRIER BOA...

RADIATION DETECTOR HAVING IMPROVED EQUALIZATION OF PIXEL RESPONSE

RADIATION DETECTOR MODULE INCLUDING APPLICATION SPECIFIC INTEGRATED...

RADIATION DETECTOR MODULE WITH LOCAL PROCESSING UNIT

SYSTEMS AND METHODS FOR K-EDGE-BASED X-RAY IMAGING HAVING IMPROVED...

SYSTEMS AND METHODS FOR MEASURING BONE MASS DENSITY USING ENERGY DI...

RADIATION DETECTOR ARRAYS HAVING INCREASED EFFICIENCY AND METHODS O...

RADIATION DETECTOR UNIT WITH THREE-SIDE BUTTABLE READ-OUT INTEGRATE...

HIGH-PERFORMANCE RADIATION DETECTORS AND METHODS OF FABRICATING THE...

CALIBRATION METHODS FOR IMPROVING UNIFORMITY IN X-RAY PHOTON COUNTI...

CHARGE SHARING CORRECTION METHODS FOR SUB-PIXELLATED RADIATION DETE...

COMPENSATION FOR CHARGE SHARING BETWEEN DETECTOR PIXELS IN A PIXILA...

TIME SIGNATURES AND PATTERN MATCHING IN X-RAY PHOTON COUNTING DETEC...

COMPTON SCATTERING CORRECTION METHODS FOR PIXELLATED RADIATION DETE...

SYSTEMS AND METHODS FOR X-RAY DIFFRACTION VIRTUAL SPECTROSCOPY

CHARGE SHARING CORRECTION METHODS FOR PIXELLATED RADIATION DETECTOR...

METHODS OF CALIBRATING SEMICONDUCTOR RADIATION DETECTORS USING K-ED...