Kuan-Ying Lai

Person

Chiayi City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method for correcting critical dimension measurements of lithograph...
- Patent number 12,147,163
- Issue date Nov 19, 2024
- United Microelectronics Corp.
- Hsin-Yu Hsieh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metal gate structure and method of fabricating the same
- Patent number 11,929,418
- Issue date Mar 12, 2024
- United Microelectronics Corp.
- Jie-Ning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal gate structure and method of fabricating the same
- Patent number 11,881,518
- Issue date Jan 23, 2024
- United Microelectronics Corp.
- Jie-Ning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a semiconductor device
- Patent number 11,488,829
- Issue date Nov 1, 2022
- United Microelectronics Corp.
- Kuan-Ying Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal gate structure and method of fabricating the same
- Patent number 11,205,705
- Issue date Dec 21, 2021
- United Microelectronics Corp.
- Jie-Ning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etching back method
- Patent number 10,777,420
- Issue date Sep 15, 2020
- United Microelectronics Corp.
- Kuan-Ying Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having asymmetric work function metal layer
- Patent number 10,505,007
- Issue date Dec 10, 2019
- United Microelectronics Corp.
- Po-Wen Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device
- Patent number 10,026,827
- Issue date Jul 17, 2018
- United Microelectronics Corp.
- Zhen Wu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CORRECTING CRITICAL DIMENSION MEASUREMENTS OF LITHOGRAPH...
- Publication number 20230152714
- Publication date May 18, 2023
- United Microelectronics Corp.
- Hsin-Yu HSIEH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF FORMING A SEMICONDUCTOR DEVICE
- Publication number 20220367192
- Publication date Nov 17, 2022
- UNITED MICROELECTRONICS CORP.
- Kuan-Ying Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL GATE STRUCTURE AND METHOD OF FABRICATING THE SAME
- Publication number 20220077300
- Publication date Mar 10, 2022
- UNITED MICROELECTRONICS CORP.
- Jie-Ning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL GATE STRUCTURE AND METHOD OF FABRICATING THE SAME
- Publication number 20220069102
- Publication date Mar 3, 2022
- UNITED MICROELECTRONICS CORP.
- Jie-Ning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ETCHING BACK METHOD
- Publication number 20200273714
- Publication date Aug 27, 2020
- UNITED MICROELECTRONICS CORP.
- Kuan-Ying Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL GATE STRUCTURE AND METHOD OF FABRICATING THE SAME
- Publication number 20200144387
- Publication date May 7, 2020
- UNITED MICROELECTRONICS CORP.
- Jie-Ning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20170309520
- Publication date Oct 26, 2017
- UNITED MICROELECTRONICS CORP.
- En-Chiuan Liou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20170294523
- Publication date Oct 12, 2017
- UNITED MICROELECTRONICS CORP.
- Zhen Wu
- H01 - BASIC ELECTRIC ELEMENTS

Kuan-Ying Lai

Person

Patents Grantslast 30 patents

Method for correcting critical dimension measurements of lithograph...

Metal gate structure and method of fabricating the same

Metal gate structure and method of fabricating the same

Method of forming a semiconductor device

Metal gate structure and method of fabricating the same

Etching back method

Semiconductor device having asymmetric work function metal layer

Method for fabricating semiconductor device

Patents Applicationslast 30 patents

METHOD FOR CORRECTING CRITICAL DIMENSION MEASUREMENTS OF LITHOGRAPH...

METHOD OF FORMING A SEMICONDUCTOR DEVICE

METAL GATE STRUCTURE AND METHOD OF FABRICATING THE SAME

METAL GATE STRUCTURE AND METHOD OF FABRICATING THE SAME

ETCHING BACK METHOD

METAL GATE STRUCTURE AND METHOD OF FABRICATING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE