Kuang-Chao Chen

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Chutung, TW

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Patents Grantslast 30 patents

Information Patent Grant
High stress oxide to eliminate BPSG/SiN cracking
- Patent number 6,136,688
- Issue date Oct 24, 2000
- Vanguard International Semiconductor Corporation
- Keng-Chu Lin
- H01 - BASIC ELECTRIC ELEMENTS