KUANG CHUNG CHOU

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TAIPEI, TW

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Patents Grantslast 30 patents

Information Patent Grant
Power supply unit having an extended hold-up time
- Patent number 10,338,658
- Issue date Jul 2, 2019
- Dell Products, L.P.
- Tsai-Fu Hung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe module supporting loopback test
- Patent number 9,500,675
- Issue date Nov 22, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Method for extending power supply hold-up time by controlling a tra...
- Patent number 9,455,637
- Issue date Sep 27, 2016
- Dell Products L.P.
- Tsai-Fu Hung
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Signal path switch and probe card having the signal path switch
- Patent number 9,442,134
- Issue date Sep 13, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POWER SUPPLY UNIT HAVING AN EXTENDED HOLD-UP TIME
- Publication number 20170329380
- Publication date Nov 16, 2017
- DELL PRODUCTS, L.P.
- TSAI-FU HUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR EXTENDING POWER SUPPLY HOLD-UP TIME BY CONTROLLING A TRA...
- Publication number 20160190934
- Publication date Jun 30, 2016
- DELL PRODUCTS, L.P.
- Tsai-Fu Hung
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
PROBE MODULE SUPPORTING LOOPBACK TEST
- Publication number 20150015290
- Publication date Jan 15, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PATH SWITCH AND PROBE CARD HAVING THE SIGNAL PATH SWITCH
- Publication number 20150015295
- Publication date Jan 15, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING