Kuang-Pu WEN

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for three-dimensional inspection
- Patent number 10,841,561
- Issue date Nov 17, 2020
- Test Research, Inc.
- Wen-Tzong Lee
- G01 - MEASURING TESTING
Information Patent Grant
Automatic optical inspection system and operating method thereof
- Patent number 10,438,340
- Issue date Oct 8, 2019
- Test Research, Inc.
- Kuang-Pu Wen
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system
- Patent number 9,885,561
- Issue date Feb 6, 2018
- Test Research, Inc.
- Liang-Pin Yu
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting device and method for inspecting inspection target
- Patent number 9,838,612
- Issue date Dec 5, 2017
- Test Research, Inc.
- Yeong-Feng Wang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring system for a 3D object
- Patent number 9,420,235
- Issue date Aug 16, 2016
- Test Research, Inc.
- Kuang-Pu Wen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Three-dimensional image measuring apparatus
- Patent number 9,019,351
- Issue date Apr 28, 2015
- Test Research Inc.
- Liang-Pin Yu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for laminography inspection
- Patent number 7,529,336
- Issue date May 5, 2009
- Test Research, Inc.
- Kuang Pu Wen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC OPTICAL INSPECTION SYSTEM AND OPERATING METHOD THEREOF
- Publication number 20180276811
- Publication date Sep 27, 2018
- Test Research, Inc.
- Kuang-Pu WEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR THREE-DIMENSIONAL INSPECTION
- Publication number 20180278911
- Publication date Sep 27, 2018
- Test Research, Inc.
- Wen-Tzong LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTING DEVICE AND METHOD FOR INSPECTING INSPECTION TARGET
- Publication number 20170019578
- Publication date Jan 19, 2017
- Test Research, Inc.
- Yeong-Feng WANG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM
- Publication number 20160169812
- Publication date Jun 16, 2016
- Test Research, Inc.
- Liang-Pin YU
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL IMAGE MEASURING APPARATUS
- Publication number 20140022357
- Publication date Jan 23, 2014
- Test Research, Inc.
- Liang-Pin YU
- G01 - MEASURING TESTING
Information Patent Application
Measuring system for a 3D Object
- Publication number 20110228082
- Publication date Sep 22, 2011
- Kuang-Pu Wen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and Method for Laminography Inspection
- Publication number 20080298538
- Publication date Dec 4, 2008
- Test Research, Inc.
- Kuang Pu Wen
- G01 - MEASURING TESTING

Kuang-Pu WEN

Person

Patents Grantslast 30 patents

Apparatus and method for three-dimensional inspection

Automatic optical inspection system and operating method thereof

Optical inspection system

Inspecting device and method for inspecting inspection target

Measuring system for a 3D object

Three-dimensional image measuring apparatus

System and method for laminography inspection

Patents Applicationslast 30 patents

AUTOMATIC OPTICAL INSPECTION SYSTEM AND OPERATING METHOD THEREOF

APPARATUS AND METHOD FOR THREE-DIMENSIONAL INSPECTION

INSPECTING DEVICE AND METHOD FOR INSPECTING INSPECTION TARGET

OPTICAL INSPECTION SYSTEM

THREE-DIMENSIONAL IMAGE MEASURING APPARATUS

Measuring system for a 3D Object

System and Method for Laminography Inspection