-
-
-
-
-
-
-
-
Barrier Layer for Copper Interconnect
-
Publication number 20150044867
-
Publication date Feb 12, 2015
-
Taiwan Semiconductor Manufacturing Company, Ltd.
-
Yu-Hung Lin
-
H01 - BASIC ELECTRIC ELEMENTS
-
-
Barrier Layer for Copper Interconnect
-
Publication number 20140191402
-
Publication date Jul 10, 2014
-
Taiwan Semiconductor Manufacturing Company, Ltd.
-
Yu-Hung Lin
-
H01 - BASIC ELECTRIC ELEMENTS
-
BARRIER LAYER FOR COPPER INTERCONNECT
-
Publication number 20140117547
-
Publication date May 1, 2014
-
Taiwan Semiconductor Manufacturing Company, Ltd.
-
Yu-Hung Lin
-
H01 - BASIC ELECTRIC ELEMENTS
-
Seed Layer Structure and Method
-
Publication number 20140084470
-
Publication date Mar 27, 2014
-
Taiwan Semiconductor Manufacturing Company, Ltd.
-
Chen-Bin Chiang
-
H01 - BASIC ELECTRIC ELEMENTS
-
RF Transceiver
-
Publication number 20130157591
-
Publication date Jun 20, 2013
-
Chung-Shan Institute of Science and Technology, Armaments, Bureau, Ministry o...
-
Chi-Ho Chang
-
G01 - MEASURING TESTING
-
Inertia Micro-Switch
-
Publication number 20130153376
-
Publication date Jun 20, 2013
-
Chung-Shan Institute of Science and Technology, Armaments, Bureau, Ministry o...
-
Li-Tin Chiang
-
H01 - BASIC ELECTRIC ELEMENTS
-
-
-
End effector with tapered fingertips
-
Publication number 20030133776
-
Publication date Jul 17, 2003
-
Taiwan Semiconductor Manufacturing Co., Ltd.
-
Kuei-Hung Lee
-
H01 - BASIC ELECTRIC ELEMENTS