Kuen J. Sun

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Yorktown, VA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for evaluating multilayer objects for imperfec...
- Patent number 5,969,253
- Issue date Oct 19, 1999
- The United States of America as represented by the Administrator of the Natio...
- Joseph S. Heyman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating multilayer objects for imperfec...
- Patent number 5,637,799
- Issue date Jun 10, 1997
- The United States of America as represented by the administrator of the Natio...
- Joseph S. Heyman
- G01 - MEASURING TESTING