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Kuljit Virk
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Context-based defect inspection
Patent number
11,922,619
Issue date
Mar 5, 2024
KLA Corporation
Brian Duffy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection and review using transmissive current image of ch...
Patent number
11,410,830
Issue date
Aug 9, 2022
KLA Corporation
Hong Xiao
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Apparatus and methods for measuring phase and amplitude of light th...
Patent number
11,131,629
Issue date
Sep 28, 2021
KLA-Tencor Corporation
Abdurrahman Sezginer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR REDUCING SAMPLE NOISE USING SELECTIVE MARKERS
Publication number
20230408422
Publication date
Dec 21, 2023
KLA Corporation
Grace Hsiu-Ling Chen
G01 - MEASURING TESTING
Information
Patent Application
CONTEXT-BASED DEFECT INSPECTION
Publication number
20230316500
Publication date
Oct 5, 2023
KLA Corporation
Brian Duffy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTI-MODE OPTICAL INSPECTION
Publication number
20230314336
Publication date
Oct 5, 2023
KLA Corporation
Kuljit S. Virk
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR OPTICAL WAFER CHARACTERIZATION WITH IMAGE UP...
Publication number
20220383470
Publication date
Dec 1, 2022
Abdurrahman Sezginer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHODS FOR MEASURING PHASE AND AMPLITUDE OF LIGHT TH...
Publication number
20180340886
Publication date
Nov 29, 2018
KLA-Tencor Corporation
Abdurrahman Sezginer
G01 - MEASURING TESTING