Kumar Shiralalgi

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Crystal Lake, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Enhanced probe for gathering data from semiconductor devices
- Patent number 6,703,258
- Issue date Mar 9, 2004
- Motorola, Inc.
- Theresa J. Hopson
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced probe for gathering data from semiconductor devices
- Patent number 6,479,892
- Issue date Nov 12, 2002
- Motorola, Inc.
- Theresa J. Hopson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Enhanced probe for gathering data from semiconductor devices
- Publication number 20020167008
- Publication date Nov 14, 2002
- Theresa J. Hopson
- B82 - NANO-TECHNOLOGY