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Kumi Nakamura
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Kanagawa-ken, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Information acquisition method, information acquisition apparatus a...
Patent number
8,436,535
Issue date
May 7, 2013
Canon Kabushiki Kaisha
Hiroyuki Hashimoto
G01 - MEASURING TESTING
Information
Patent Grant
Information acquisition method, information acquisition apparatus a...
Patent number
7,701,138
Issue date
Apr 20, 2010
Canon Kabushiki Kaisha
Hiroyuki Hashimoto
G01 - MEASURING TESTING
Information
Patent Grant
Electron-emitting device, electron source using the electron-emitti...
Patent number
7,291,962
Issue date
Nov 6, 2007
Canon Kabushiki Kaisha
Taiko Motoi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron-emitting device having carbon films with a particular orie...
Patent number
6,917,146
Issue date
Jul 12, 2005
Canon Kabushiki Kaisha
Taiko Motoi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron-emitting device, electron source using the electron-emitti...
Patent number
6,888,296
Issue date
May 3, 2005
Canon Kabushiki Kaisha
Taiko Motoi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron-emitting device, electron source using electron-emitting d...
Patent number
6,851,998
Issue date
Feb 8, 2005
Canon Kabushiki Kaisha
Toshiaki Aiba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron-emitting device, electron source using the electron-emitti...
Patent number
6,380,665
Issue date
Apr 30, 2002
Canon Kabushiki Kaisha
Taiko Motoi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing electron-emitting device, electron source a...
Patent number
6,017,259
Issue date
Jan 25, 2000
Canon Kabushiki Kaisha
Taiko Motoi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
INFORMATION ACQUISITION METHOD, INFORMATION ACQUISITION APPARATUS A...
Publication number
20100227308
Publication date
Sep 9, 2010
Canon Kabushiki Kaisha
Hiroyuki Hashimoto
G01 - MEASURING TESTING
Information
Patent Application
Information acquisition method, information acquisition apparatus a...
Publication number
20060183235
Publication date
Aug 17, 2006
Canon Kabushiki Kaisha
Hiroyuki Hashimoto
G01 - MEASURING TESTING
Information
Patent Application
Electron-emitting device, electron source using the electron-emitti...
Publication number
20050052108
Publication date
Mar 10, 2005
Canon Kabushiki Kaisha
Taiko Motoi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON-EMITTING DEVICE, ELECTRON SOURCE USING ELECTRON-EMITTING D...
Publication number
20040245905
Publication date
Dec 9, 2004
Cannon Kabushiki Kaisha
Toshiaki Aiba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Probe immobilized substrate and method for manufacturing the same,...
Publication number
20040053308
Publication date
Mar 18, 2004
Canon Kabushiki Kaisha
Kumi Nakamura
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
Electron-emitting device, electron source using the electron-emitti...
Publication number
20020096986
Publication date
Jul 25, 2002
Taiko Motoi
H01 - BASIC ELECTRIC ELEMENTS