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Kumiko HORIKOSHI
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Radiation inspection apparatus
Patent number
9,194,823
Issue date
Nov 24, 2015
Yokogawa Electric Corporation
Hirohiko Obinata
G01 - MEASURING TESTING
Information
Patent Grant
Material property measuring apparatus
Patent number
9,170,194
Issue date
Oct 27, 2015
Yokogawa Electric Corporation
Yasushi Ichizawa
G01 - MEASURING TESTING
Information
Patent Grant
Multichannel photometric measurement apparatus
Patent number
8,547,544
Issue date
Oct 1, 2013
Yokogawa Electric Corporation
Kumiko Horikoshi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INFORMATION PROVIDING APPARATUS, INFORMATION PROVIDING METHOD, AND...
Publication number
20240410834
Publication date
Dec 12, 2024
YOKOGAWA ELECTRIC CORPORATION
Kazufumi NISHIDA
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATING SPHERE
Publication number
20230062325
Publication date
Mar 2, 2023
YOKOGAWA ELECTRIC CORPORATION
Kazufumi Nishida
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL PROPERTY MEASURING APPARATUS
Publication number
20150090885
Publication date
Apr 2, 2015
Yokogawa Electric Corporation
Yasushi Ichizawa
G01 - MEASURING TESTING
Information
Patent Application
INFRARED ANALYSIS APPARATUS
Publication number
20120218542
Publication date
Aug 30, 2012
YOKOGAWA ELECTRIC CORPORATION
Yasushi ICHIZAWA
G01 - MEASURING TESTING
Information
Patent Application
RADIATION INSPECTION APPARATUS
Publication number
20120221275
Publication date
Aug 30, 2012
YOKOGAWA ELECTRIC CORPORATION
Hirohiko OBINATA
G01 - MEASURING TESTING
Information
Patent Application
MULTICHANNEL PHOTOMETRIC MEASUREMENT APPARATUS
Publication number
20120019815
Publication date
Jan 26, 2012
YOKOGAWA ELECTRIC CORPORATION
Kumiko Horikoshi
G01 - MEASURING TESTING