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Kumiko Kamihara

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,280,733
    • Issue date Mar 22, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer for identifying a cause of abnormalities of meas...
    • Patent number 10,352,864
    • Issue date Jul 16, 2019
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,288,637
    • Issue date May 14, 2019
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device and automatic analysis method
    • Patent number 10,203,277
    • Issue date Feb 12, 2019
    • Hitachi High-Technologies Corporation
    • Chihiro Manri
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,897,624
    • Issue date Feb 20, 2018
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,857,388
    • Issue date Jan 2, 2018
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Data processing device and automatic analysis device using same
    • Patent number 9,841,413
    • Issue date Dec 12, 2017
    • Hitachi High-Technologies Corporation
    • Naomi Ishii
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,599,631
    • Issue date Mar 21, 2017
    • Hitachi High-Technologies Corporation
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device and automatic analysis program
    • Patent number 9,562,917
    • Issue date Feb 7, 2017
    • Hitachi High-Technologies Corporation
    • Chihiro Manri
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,488,667
    • Issue date Nov 8, 2016
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device and analysis method
    • Patent number 9,476,893
    • Issue date Oct 25, 2016
    • Hitachi High-Technologies Corporation
    • Satoshi Mitsuyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and method for determining malfunction thereof
    • Patent number 9,470,570
    • Issue date Oct 18, 2016
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,383,376
    • Issue date Jul 5, 2016
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,335,335
    • Issue date May 10, 2016
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and analysis method
    • Patent number 9,310,388
    • Issue date Apr 12, 2016
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analzyer
    • Patent number 8,150,645
    • Issue date Apr 3, 2012
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180128741
    • Publication date May 10, 2018
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170089938
    • Publication date Mar 30, 2017
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150362514
    • Publication date Dec 17, 2015
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150323557
    • Publication date Nov 12, 2015
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150219680
    • Publication date Aug 6, 2015
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    DATA PROCESSING DEVICE AND AUTOMATIC ANALYSIS DEVICE USING SAME
    • Publication number 20150198579
    • Publication date Jul 16, 2015
    • Hitachi High-Technologies Corporation
    • Naomi Ishii
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140220693
    • Publication date Aug 7, 2014
    • Hitachi High-Technologies Corporation
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR DETERMINING MALFUNCTION THEREOF
    • Publication number 20140190253
    • Publication date Jul 10, 2014
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS PROGRAM
    • Publication number 20140136123
    • Publication date May 15, 2014
    • Hitachi High-Technologies Corporation
    • Chihiro Manri
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130266484
    • Publication date Oct 10, 2013
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER, ANALYSIS METHOD, AND INFORMATION PROCESSOR
    • Publication number 20130122596
    • Publication date May 16, 2013
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20130046480
    • Publication date Feb 21, 2013
    • Chihiro Manri
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ANALYSIS METHOD
    • Publication number 20120109534
    • Publication date May 3, 2012
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120065898
    • Publication date Mar 15, 2012
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND ANALYSIS METHOD
    • Publication number 20120064636
    • Publication date Mar 15, 2012
    • Hitachi High-Technologies Corporation
    • Satoshi Mitsuyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20110301917
    • Publication date Dec 8, 2011
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALZYER
    • Publication number 20090198463
    • Publication date Aug 6, 2009
    • Kumiko KAMIHARA
    • G01 - MEASURING TESTING