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Kun-Han Tsai
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Lake Oswego, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Input data compression for machine learning-based chain diagnosis
Patent number
11,681,843
Issue date
Jun 20, 2023
SIEMENS INDUSTRY SOFTWARE INC.
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-stage machine learning-based chain diagnosis
Patent number
11,361,248
Issue date
Jun 14, 2022
SIEMENS INDUSTRY SOFTWARE INC.
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Deterministic test pattern generation for designs with timing excep...
Patent number
10,977,400
Issue date
Apr 13, 2021
Mentor Graphics Corporation
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Timing-aware test generation and fault simulation
Patent number
10,509,073
Issue date
Dec 17, 2019
Mentor Graphics Corporation
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wide-range clock signal generation for speed grading of logic cores
Patent number
10,317,462
Issue date
Jun 11, 2019
Mentor Graphics Corporation
Shi-Yu Huang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Timing-aware test generation and fault simulation
Patent number
9,720,040
Issue date
Aug 1, 2017
Mentor Graphics Corporation
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and circuit of pulse-vanishing test
Patent number
9,720,038
Issue date
Aug 1, 2017
Mentor Graphics, A Siemens Business
Shi-Yu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Timing-aware test generation and fault simulation
Patent number
9,086,454
Issue date
Jul 21, 2015
Mentor Graphics Corporation
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Grant
Timing-aware test generation and fault simulation
Patent number
8,560,906
Issue date
Oct 15, 2013
Mentor Graphics Corporation
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic test pattern generation for small delay defect
Patent number
8,527,232
Issue date
Sep 3, 2013
Mentor Graphics Corporation
Ruifeng Guo
G01 - MEASURING TESTING
Information
Patent Grant
Speed-path debug using at-speed scan test patterns
Patent number
8,468,409
Issue date
Jun 18, 2013
Mentor Graphics Corporation
Ruifeng Guo
G01 - MEASURING TESTING
Information
Patent Grant
Compactor independent fault diagnosis
Patent number
8,301,414
Issue date
Oct 30, 2012
Mentor Graphics Corporation
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Timing-aware test generation and fault simulation
Patent number
8,051,352
Issue date
Nov 1, 2011
Mentor Graphics Corporation
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Grant
Generating responses to patterns stimulating an electronic circuit...
Patent number
7,984,354
Issue date
Jul 19, 2011
Mentor Graphics Corporation
Dhiraj Goswami
G01 - MEASURING TESTING
Information
Patent Grant
Generating responses to patterns stimulating an electronic circuit...
Patent number
7,555,689
Issue date
Jun 30, 2009
Dhiraj Goswami
G01 - MEASURING TESTING
Information
Patent Grant
Compactor independent fault diagnosis
Patent number
7,239,978
Issue date
Jul 3, 2007
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
DETERMINISTIC TEST PATTERN GENERATION FOR DESIGNS WITH TIMING EXCEP...
Publication number
20200410065
Publication date
Dec 31, 2020
Mentor Graphics Corporation
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Multi-Stage Machine Learning-Based Chain Diagnosis
Publication number
20190220776
Publication date
Jul 18, 2019
Mentor Graphics Corporation
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Input Data Compression For Machine Learning-Based Chain Diagnosis
Publication number
20190220745
Publication date
Jul 18, 2019
Mentor Graphics Corporation
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TIMING-AWARE TEST GENERATION AND FAULT SIMULATION
Publication number
20180045780
Publication date
Feb 15, 2018
Mentor Graphics Corporation
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Application
Wide-Range Clock Signal Generation For Speed Grading Of Logic Cores
Publication number
20170328952
Publication date
Nov 16, 2017
Mentor Graphics Corporation
Shi-Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
TIMING-AWARE TEST GENERATION AND FAULT SIMULATION
Publication number
20150323600
Publication date
Nov 12, 2015
Mentor Graphics Corporation
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Application
Method and Circuit Of Pulse-Vanishing Test
Publication number
20140347088
Publication date
Nov 27, 2014
Mentor Graphics Corporation
Shi-Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
Programmable Leakage Test For Interconnects In Stacked Designs
Publication number
20140246705
Publication date
Sep 4, 2014
Mentor Graphics Corporation
Shi-Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
TIMING-AWARE TEST GENERATION AND FAULT SIMULATION
Publication number
20140047404
Publication date
Feb 13, 2014
Mentor Graphics Corporation
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Application
TIMING-AWARE TEST GENERATION AND FAULT SIMULATION
Publication number
20120174049
Publication date
Jul 5, 2012
Mentor Graphics Corporation
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Diagnostic Test Pattern Generation For Small Delay Defect
Publication number
20100274518
Publication date
Oct 28, 2010
Mentor Graphics Corporation
Ruifeng Guo
G01 - MEASURING TESTING
Information
Patent Application
Speed-Path Debug Using At-Speed Scan Test Patterns
Publication number
20100185908
Publication date
Jul 22, 2010
Ruifeng Guo
G01 - MEASURING TESTING
Information
Patent Application
GENERATING RESPONSES TO PATTERNS STIMULATING AN ELECTRONIC CIRCUIT...
Publication number
20090327986
Publication date
Dec 31, 2009
Dhiraj Goswami
G01 - MEASURING TESTING
Information
Patent Application
Timing-aware test generation and fault simulation
Publication number
20070288822
Publication date
Dec 13, 2007
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMPACTOR INDEPENDENT FAULT DIAGNOSIS
Publication number
20070283202
Publication date
Dec 6, 2007
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Generating responses to patterns stimulating an electronic circuit...
Publication number
20070011527
Publication date
Jan 11, 2007
Dhiraj Goswami
G01 - MEASURING TESTING
Information
Patent Application
Compactor independent fault diagnosis
Publication number
20050222816
Publication date
Oct 6, 2005
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING