Kun Liu

Person

Peabody, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 12,165,839
- Issue date Dec 10, 2024
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reconstruction algorithms of electron-based holograms
- Patent number 11,782,385
- Issue date Oct 10, 2023
- FEI Company
- Kun Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mechanically-stable electron source
- Patent number 11,749,492
- Issue date Sep 5, 2023
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 11,749,498
- Issue date Sep 5, 2023
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coupling for connecting analytical systems with vibrational isolation
- Patent number 11,699,582
- Issue date Jul 11, 2023
- FEI Company
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing microrods for electron emitters, and associated...
- Patent number 11,651,924
- Issue date May 16, 2023
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam source
- Patent number 11,380,511
- Issue date Jul 5, 2022
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 11,217,425
- Issue date Jan 4, 2022
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed CFE electron source with fast blanker for ultrafast TEM appl...
- Patent number 11,114,272
- Issue date Sep 7, 2021
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gun lens design in a charged particle microscope
- Patent number 10,410,827
- Issue date Sep 10, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determination of emission parameters from field emission sources
- Patent number 8,779,376
- Issue date Jul 15, 2014
- FEI Company
- Lynwood W. Swanson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stable cold field emission electron source
- Patent number 8,736,170
- Issue date May 27, 2014
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for modifying small structures
- Patent number 8,163,641
- Issue date Apr 24, 2012
- FEI Company
- George Y. Gu
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
System for modifying small structures using localized charge transf...
- Patent number 7,674,706
- Issue date Mar 9, 2010
- FEI Company
- George Y. Gu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold cathode ion gauge
- Patent number 7,098,667
- Issue date Aug 29, 2006
- FEI Company
- Kun Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20240021407
- Publication date Jan 18, 2024
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SOURCE
- Publication number 20230011267
- Publication date Jan 12, 2023
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MECHANICALLY-STABLE ELECTRON SOURCE
- Publication number 20220293387
- Publication date Sep 15, 2022
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20220115205
- Publication date Apr 14, 2022
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COUPLING FOR CONNECTING ANALYTICAL SYSTEMS WITH VIBRATIONAL ISOLATION
- Publication number 20220084806
- Publication date Mar 17, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SOURCE
- Publication number 20210305006
- Publication date Sep 30, 2021
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTON-INDUCED ION SOURCE
- Publication number 20210183608
- Publication date Jun 17, 2021
- FEI Company
- Kun LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECONSTRUCTION ALGORITHMS OF ELECTRON-BASED HOLOGRAMS
- Publication number 20210181676
- Publication date Jun 17, 2021
- FEI Company
- Kun Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PULSED CFE ELECTRON SOURCE WITH FAST BLANKER FOR ULTRAFAST TEM APPL...
- Publication number 20210090846
- Publication date Mar 25, 2021
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20200411282
- Publication date Dec 31, 2020
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180323036
- Publication date Nov 8, 2018
- FEI Company
- Ali Mohammadi-Gheidari
- G02 - OPTICS
Information Patent Application
Determination of Emission Parameters from Field Emission Sources
- Publication number 20130187058
- Publication date Jul 25, 2013
- FEI Company
- Lynwood W. Swanson
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MODIFYING SMALL STRUCTURES
- Publication number 20100151679
- Publication date Jun 17, 2010
- FEI Company
- George Y. Gu
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
System for modifying small structures
- Publication number 20050227484
- Publication date Oct 13, 2005
- FEI Company
- George Y. Gu
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Cold cathode ion gauge
- Publication number 20050140375
- Publication date Jun 30, 2005
- Kun Liu
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

System and method for preparation and delivery of biological sample...

Reconstruction algorithms of electron-based holograms

Mechanically-stable electron source

System and method for preparation and delivery of biological sample...

Coupling for connecting analytical systems with vibrational isolation

Method of producing microrods for electron emitters, and associated...

Charged particle beam source

System and method for preparation and delivery of biological sample...

Pulsed CFE electron source with fast blanker for ultrafast TEM appl...

Gun lens design in a charged particle microscope

Determination of emission parameters from field emission sources

Stable cold field emission electron source

System for modifying small structures

System for modifying small structures using localized charge transf...

Cold cathode ion gauge

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

CHARGED PARTICLE BEAM SOURCE

MECHANICALLY-STABLE ELECTRON SOURCE

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

COUPLING FOR CONNECTING ANALYTICAL SYSTEMS WITH VIBRATIONAL ISOLATION

CHARGED PARTICLE BEAM SOURCE

PHOTON-INDUCED ION SOURCE

RECONSTRUCTION ALGORITHMS OF ELECTRON-BASED HOLOGRAMS

PULSED CFE ELECTRON SOURCE WITH FAST BLANKER FOR ULTRAFAST TEM APPL...

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE

Determination of Emission Parameters from Field Emission Sources

SYSTEM FOR MODIFYING SMALL STRUCTURES

System for modifying small structures

Cold cathode ion gauge