Kun Pan

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Allen, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Digital micromirror device having wavelength-dependent modulation s...
- Patent number 8,139,284
- Issue date Mar 20, 2012
- Texas Instruments Incorporated
- Kun C. Pan
- G02 - OPTICS
Information Patent Grant
System and method for actuation of spatial light modulators
- Patent number 7,995,264
- Issue date Aug 9, 2011
- Texas Instruments Incorporated
- Kun Cindy Pan
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method and apparatus for measuring temporal response characteristic...
- Patent number 7,095,494
- Issue date Aug 22, 2006
- Texas Instruments Incorporated
- David Joseph Mehrl
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for using spatial patterns for measuring mirro...
- Patent number 6,831,750
- Issue date Dec 14, 2004
- Texas Instruments Incorporated
- David J. Mehrl
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Actuation of Spatial Light Modulators
- Publication number 20100195189
- Publication date Aug 5, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Kun Cindy Pan
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
DIGITAL MICROMIRROR DEVICE HAVING WAVELENGTH-DEPENDENT MODULATION S...
- Publication number 20100103498
- Publication date Apr 29, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Kun C. Pan
- G02 - OPTICS
Information Patent Application
Method and apparatus for measuring temporal response characteristic...
- Publication number 20040042000
- Publication date Mar 4, 2004
- TEXAS INSTRUMENTS INCORPORATED
- David Joseph Mehrl
- G02 - OPTICS
Information Patent Application
Method and appraratus for using spatial patterns for measuring mirr...
- Publication number 20030223084
- Publication date Dec 4, 2003
- TEXAS INSTRUMENTS INCORPORATED
- David J. Mehrl
- G01 - MEASURING TESTING