Kun-Tsang CHUANG

Person

Miaoli County, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Reducing RC delay in semiconductor devices
- Patent number 12,230,574
- Issue date Feb 18, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and method for manufacturing the same
- Patent number 12,211,934
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and method for manufacturing the same
- Patent number 12,199,181
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a metal-oxide-semiconductor field-effect tr...
- Patent number 12,191,196
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with air-void in spacer
- Patent number 12,027,581
- Issue date Jul 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of testing wafer
- Patent number 12,009,302
- Issue date Jun 11, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source/drain epitaxial layer profile
- Patent number 11,942,547
- Issue date Mar 26, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a wall structure surrounding a stacked...
- Patent number 11,925,017
- Issue date Mar 5, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Hsuan Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer with devices having different top layer thickne...
- Patent number 11,887,987
- Issue date Jan 30, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOSFET device structure with air-gaps in spacer and methods for for...
- Patent number 11,855,170
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple thickness semiconductor-on-insulator field effect transist...
- Patent number 11,817,345
- Issue date Nov 14, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing RC delay in semiconductor devices
- Patent number 11,804,439
- Issue date Oct 31, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a semiconductor structure
- Patent number 11,594,449
- Issue date Feb 28, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chih-Ming Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a metal-oxide-semiconductor field-effect tr...
- Patent number 11,476,157
- Issue date Oct 18, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source/drain epitaxial layer profile
- Patent number 11,462,642
- Issue date Oct 4, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of testing wafer
- Patent number 11,430,733
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor arrangement with airgap and method of forming
- Patent number 11,417,749
- Issue date Aug 16, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with air-void in spacer
- Patent number 11,404,537
- Issue date Aug 2, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple thickness semiconductor-on-insulator field effect transist...
- Patent number 11,398,403
- Issue date Jul 26, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOSFET device structure with air-gaps in spacer and methods for for...
- Patent number 11,367,778
- Issue date Jun 21, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer with devices having different top layer thickne...
- Patent number 11,348,944
- Issue date May 31, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing RC delay in semiconductor devices
- Patent number 11,335,638
- Issue date May 17, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation regions for reduced junction leakage
- Patent number 11,264,456
- Issue date Mar 1, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a bulk semiconductor substrate configured to exh...
- Patent number 11,211,283
- Issue date Dec 28, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structures and methods for noise isolation in semiconductor devices
- Patent number 11,183,570
- Issue date Nov 23, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal-insulator-metal capacitors with high breakdown voltage
- Patent number 11,171,199
- Issue date Nov 9, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Ting Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shallow trench isolation for integrated circuits
- Patent number 11,145,539
- Issue date Oct 12, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and method for forming the same
- Patent number 11,121,141
- Issue date Sep 14, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chiang-Ming Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Brushless DC motor fan
- Patent number 11,101,714
- Issue date Aug 24, 2021
- Delta Electronics, Inc.
- Chih-Wei Lin
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor structure
- Patent number 10,964,589
- Issue date Mar 30, 2021
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chih-Ming Lee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ADSORPTION UNIT
- Publication number 20250099897
- Publication date Mar 27, 2025
- Delta Electronics, Inc.
- Chin-Chun LAI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ADSORPTION UNIT HAVING SPACER PIECES
- Publication number 20250099898
- Publication date Mar 27, 2025
- Delta Electronics, Inc.
- Chin-Chun LAI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ADSORPTION UNITLIMITING SPRING HAVING SPRING STRUCTURE
- Publication number 20250099899
- Publication date Mar 27, 2025
- Delta Electronics, Inc.
- Chin-Chun LAI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
CARBON CAPTURE SYSTEM
- Publication number 20250099900
- Publication date Mar 27, 2025
- Delta Electronics, Inc.
- Chin-Chun LAI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20250096038
- Publication date Mar 20, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCING RC DELAY IN SEMICONDUCTOR DEVICES
- Publication number 20240379563
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER
- Publication number 20240321954
- Publication date Sep 26, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE/DRAIN EPITAXIAL LAYER PROFILE
- Publication number 20240194784
- Publication date Jun 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER WITH DEVICES HAVING DIFFERENT TOP LAYER THICKNE...
- Publication number 20240170489
- Publication date May 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING STACKS ASIDE STACKED GATE STRUCTURE AND...
- Publication number 20240172434
- Publication date May 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Hsuan Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SMART TEMPERATURE CONTROL SYSTEM OF NETWORK EQUIPMENT
- Publication number 20240160259
- Publication date May 16, 2024
- Alpha Networks Inc.
- KUN-NENG CHUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MOSFET DEVICE STRUCTURE WITH AIR-GAPS IN SPACER AND METHODS FOR FOR...
- Publication number 20240079471
- Publication date Mar 7, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240079493
- Publication date Mar 7, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- GUAN-QI CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCING RC DELAY IN SEMICONDUCTOR DEVICES
- Publication number 20230378071
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20230378347
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220367242
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING WAFER
- Publication number 20220359395
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE/DRAIN EPITAXIAL LAYER PROFILE
- Publication number 20220359751
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR ARRANGEMENT WITH AIRGAP AND METHOD OF FORMING
- Publication number 20220359707
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER
- Publication number 20220352307
- Publication date Nov 3, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE THICKNESS SEMICONDUCTOR-ON-INSULATOR FIELD EFFECT TRANSIST...
- Publication number 20220328345
- Publication date Oct 13, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER WITH DEVICES HAVING DIFFERENT TOP LAYER THICKNE...
- Publication number 20220285403
- Publication date Sep 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reducing RC Delay in Semiconductor Devices
- Publication number 20220278042
- Publication date Sep 1, 2022
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOSFET DEVICE STRUCTURE WITH AIR-GAPS IN SPACER AND METHODS FOR FOR...
- Publication number 20220271141
- Publication date Aug 25, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220246756
- Publication date Aug 4, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220216095
- Publication date Jul 7, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE THICKNESS SEMICONDUCTOR-ON-INSULATOR FIELD EFFECT TRANSIST...
- Publication number 20210375666
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURES AND METHODS FOR NOISE ISOLATION IN SEMICONDUCTOR DEVICES
- Publication number 20210328031
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER
- Publication number 20210328009
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCING RC DELAY IN SEMICONDUCTOR DEVICES
- Publication number 20210327813
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS

Kun-Tsang CHUANG

Person

Patents Grantslast 30 patents

Reducing RC delay in semiconductor devices

Semiconductor structure and method for manufacturing the same

Semiconductor structure and method for manufacturing the same

Method of manufacturing a metal-oxide-semiconductor field-effect tr...

Semiconductor device with air-void in spacer

Method of testing wafer

Source/drain epitaxial layer profile

Semiconductor device having a wall structure surrounding a stacked...

Semiconductor wafer with devices having different top layer thickne...

MOSFET device structure with air-gaps in spacer and methods for for...

Multiple thickness semiconductor-on-insulator field effect transist...

Reducing RC delay in semiconductor devices

Method of making a semiconductor structure

Method of manufacturing a metal-oxide-semiconductor field-effect tr...

Source/drain epitaxial layer profile

Method of testing wafer

Semiconductor arrangement with airgap and method of forming

Semiconductor device with air-void in spacer

Multiple thickness semiconductor-on-insulator field effect transist...

MOSFET device structure with air-gaps in spacer and methods for for...

Semiconductor wafer with devices having different top layer thickne...

Reducing RC delay in semiconductor devices

Isolation regions for reduced junction leakage

Method for forming a bulk semiconductor substrate configured to exh...

Structures and methods for noise isolation in semiconductor devices

Metal-insulator-metal capacitors with high breakdown voltage

Shallow trench isolation for integrated circuits

Semiconductor structure and method for forming the same

Brushless DC motor fan

Semiconductor structure

Patents Applicationslast 30 patents

ADSORPTION UNIT

ADSORPTION UNIT HAVING SPACER PIECES

ADSORPTION UNITLIMITING SPRING HAVING SPRING STRUCTURE

CARBON CAPTURE SYSTEM

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

REDUCING RC DELAY IN SEMICONDUCTOR DEVICES

SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER

SOURCE/DRAIN EPITAXIAL LAYER PROFILE

SEMICONDUCTOR WAFER WITH DEVICES HAVING DIFFERENT TOP LAYER THICKNE...

SEMICONDUCTOR DEVICE HAVING STACKS ASIDE STACKED GATE STRUCTURE AND...

SMART TEMPERATURE CONTROL SYSTEM OF NETWORK EQUIPMENT

MOSFET DEVICE STRUCTURE WITH AIR-GAPS IN SPACER AND METHODS FOR FOR...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

REDUCING RC DELAY IN SEMICONDUCTOR DEVICES

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

METHOD OF TESTING WAFER

SOURCE/DRAIN EPITAXIAL LAYER PROFILE

SEMICONDUCTOR ARRANGEMENT WITH AIRGAP AND METHOD OF FORMING

SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER

MULTIPLE THICKNESS SEMICONDUCTOR-ON-INSULATOR FIELD EFFECT TRANSIST...

SEMICONDUCTOR WAFER WITH DEVICES HAVING DIFFERENT TOP LAYER THICKNE...

Reducing RC Delay in Semiconductor Devices

MOSFET DEVICE STRUCTURE WITH AIR-GAPS IN SPACER AND METHODS FOR FOR...

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

MULTIPLE THICKNESS SEMICONDUCTOR-ON-INSULATOR FIELD EFFECT TRANSIST...

STRUCTURES AND METHODS FOR NOISE ISOLATION IN SEMICONDUCTOR DEVICES

SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER

REDUCING RC DELAY IN SEMICONDUCTOR DEVICES