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Kunal Mukherjee
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White Plains, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Dislocation glide suppression for misfit dislocation free heteroepi...
Patent number
11,804,525
Issue date
Oct 31, 2023
The Regents of the University of California
John Bowers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-junction photovoltaic cells
Patent number
11,482,573
Issue date
Oct 25, 2022
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron channeling pattern acquisition from small crystalline areas
Patent number
11,003,942
Issue date
May 11, 2021
International Business Machines Corporation
Stephen W. Bedell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Post growth heteroepitaxial layer separation for defect reduction i...
Patent number
10,755,925
Issue date
Aug 25, 2020
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fabrication method of all solid-state thin-film battery
Patent number
10,581,109
Issue date
Mar 3, 2020
International Business Machines Corporation
Joel P. de Souza
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light emitting diode having improved quantum efficiency at low inje...
Patent number
10,529,890
Issue date
Jan 7, 2020
International Business Machines Corporation
Ning Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Post growth heteroepitaxial layer separation for defect reduction i...
Patent number
10,460,937
Issue date
Oct 29, 2019
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Post growth heteroepitaxial layer separation for defect reduction i...
Patent number
10,453,683
Issue date
Oct 22, 2019
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron channeling pattern acquisition from small crystalline areas
Patent number
10,417,519
Issue date
Sep 17, 2019
International Business Machines Corporation
Stephen W. Bedell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surface passivation having reduced interface defect density
Patent number
10,177,062
Issue date
Jan 8, 2019
International Business Machines Corporation
Joel P. de Souza
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Surface passivation having reduced interface defect density
Patent number
10,170,388
Issue date
Jan 1, 2019
International Business Machines Corporation
Joel P. de Souza
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron channeling pattern acquisition from small crystalline areas
Patent number
10,127,649
Issue date
Nov 13, 2018
International Business Machines Corporation
Stephen W. Bedell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Light emitting diode having improved quantum efficiency at low inje...
Patent number
10,043,941
Issue date
Aug 7, 2018
International Business Machines Corporation
Ning Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Surface passivation having reduced interface defect density
Patent number
9,984,949
Issue date
May 29, 2018
International Business Machines Corporation
Joel P. de Souza
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automatic alignment for high throughput electron channeling contras...
Patent number
9,859,091
Issue date
Jan 2, 2018
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-beam electron microscope for electron channeling contrast ima...
Patent number
9,741,532
Issue date
Aug 22, 2017
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automatic defect detection and classification for high throughput e...
Patent number
9,739,728
Issue date
Aug 22, 2017
International Business Machines Corporation
Stephen W. Bedell
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
QUANTUM DOT LASERS AND METHODS FOR MAKING THE SAME
Publication number
20210218230
Publication date
Jul 15, 2021
The Regents of the University of California
John E. BOWERS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DISLOCATION GLIDE SUPPRESSION FOR MISFIT DISLOCATION FREE HETEROEPI...
Publication number
20210111087
Publication date
Apr 15, 2021
The Regents of the University of California
John Bowers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POST GROWTH HETEROEPITAXIAL LAYER SEPARATION FOR DEFECT REDUCTION I...
Publication number
20190341250
Publication date
Nov 7, 2019
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON CHANNELING PATTERN ACQUISITION FROM SMALL CRYSTALLINE AREAS
Publication number
20190318193
Publication date
Oct 17, 2019
International Business Machines Corporation
Stephen W. Bedell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTI-JUNCTION PHOTOVOLTAIC CELLS
Publication number
20180331158
Publication date
Nov 15, 2018
International Business Machines Corporation
Stephen W. Bedell
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
MULTI-JUNCTION PHOTOVOLTAIC CELLS
Publication number
20180331157
Publication date
Nov 15, 2018
International Business Machines Corporation
Stephen W. Bedell
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
LIGHT EMITTING DIODE HAVING IMPROVED QUANTUM EFFICIENCY AT LOW INJE...
Publication number
20180301593
Publication date
Oct 18, 2018
International Business Machines Corporation
NING LI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FABRICATION METHOD OF ALL SOLID-STATE THIN-FILM BATTERY
Publication number
20180287186
Publication date
Oct 4, 2018
International Business Machines Corporation
Joel P. de Souza
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FABRICATION METHOD OF ALL SOLID-STATE THIN-FILM BATTERY
Publication number
20180287188
Publication date
Oct 4, 2018
International Business Machines Corporation
Joel P. de Souza
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POST GROWTH HETEROEPITAXIAL LAYER SEPARATION FOR DEFECT REDUCTION I...
Publication number
20180277367
Publication date
Sep 27, 2018
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POST GROWTH HETEROEPITAXIAL LAYER SEPARATION FOR DEFECT REDUCTION I...
Publication number
20180277368
Publication date
Sep 27, 2018
International Business Machines Corporation
Stephen W. Bedell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIGHT EMITTING DIODE HAVING IMPROVED QUANTUM EFFICIENCY AT LOW INJE...
Publication number
20180219122
Publication date
Aug 2, 2018
International Business Machines Corporation
NING LI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON CHANNELING PATTERN ACQUISITION FROM SMALL CRYSTALLINE AREAS
Publication number
20180211378
Publication date
Jul 26, 2018
International Business Machines Corporation
Stephen W. Bedell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTRON CHANNELING PATTERN ACQUISITION FROM SMALL CRYSTALLINE AREAS
Publication number
20180211376
Publication date
Jul 26, 2018
International Business Machines Corporation
Stephen W. Bedell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SURFACE PASSIVATION HAVING REDUCED INTERFACE DEFECT DENSITY
Publication number
20180197804
Publication date
Jul 12, 2018
International Business Machines Corporation
Joel P. de Souza
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SURFACE PASSIVATION HAVING REDUCED INTERFACE DEFECT DENSITY
Publication number
20180197805
Publication date
Jul 12, 2018
International Business Machines Corporation
Joel P. de Souza
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AUTOMATIC ALIGNMENT FOR HIGH THROUGHPUT ELECTRON CHANNELING CONTRAS...
Publication number
20170365441
Publication date
Dec 21, 2017
International Business Machines Corporation
Stephen W. Bedell
G01 - MEASURING TESTING