Kuniaki Bannai

Follow

Person

Oosato-mura, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of transferring IC devices on test handler
- Patent number 6,259,247
- Issue date Jul 10, 2001
- Advantest Corp.
- Kuniaki Bannai
- G01 - MEASURING TESTING
Information Patent Grant
Horizontal transfer test handler
- Patent number 6,184,675
- Issue date Feb 6, 2001
- Advantest Corp.
- Kuniaki Bannai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device transporting and handling apparatus
- Patent number 6,078,188
- Issue date Jun 20, 2000
- Advantest Corporation
- Kuniaki Bannai
- G01 - MEASURING TESTING
Information Patent Grant
Automatic testing system and method for semiconductor devices
- Patent number 5,788,084
- Issue date Aug 4, 1998
- Advantest Corporation
- Takeshi Onishi
- G01 - MEASURING TESTING