Kunihiko Hatsushika

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Niraksaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 8,456,186
- Issue date Jun 4, 2013
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 7,242,206
- Issue date Jul 10, 2007
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 7,091,733
- Issue date Aug 15, 2006
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RELIABILITY EVALUATION TEST APPARATUS, RELIABILITY EVALUATION TEST...
- Publication number 20080018355
- Publication date Jan 24, 2008
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Reliability evaluation test apparatus, reliability evaluation test...
- Publication number 20050253575
- Publication date Nov 17, 2005
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Reliability evaluation test apparatus, reliability evaluation test...
- Publication number 20040183561
- Publication date Sep 23, 2004
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING