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Kunihiko NAKAYAMA
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Tama, JP
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Patents Grants
last 30 patents
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Patent Grant
Radiation detection apparatus and radiation detection method
Patent number
9,927,536
Issue date
Mar 27, 2018
Kabushiki Kaisha Toshiba
Hidehiko Kuroda
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detector and radiation detection method
Patent number
9,523,776
Issue date
Dec 20, 2016
Kabushiki Kaisha Toshiba
Hidehiko Kuroda
G01 - MEASURING TESTING
Information
Patent Grant
Light detection unit and alpha ray observation device
Patent number
9,279,889
Issue date
Mar 8, 2016
Kabushiki Kaisha Toshiba
Naoto Kume
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
ALPHA RAY OBSERVATION APPARATUS, ALPHA RAY OBSERVATION SYSTEM AND A...
Publication number
20150369932
Publication date
Dec 24, 2015
KABUSHIKI KAISHA TOSHIBA
Naoto KUME
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR AND RADIATION DETECTION METHOD
Publication number
20150323678
Publication date
Nov 12, 2015
KABUSHIKI KAISHA TOSHIBA
Hidehiko KURODA
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION UNIT AND ALPHA RAY OBSERVATION DEVICE
Publication number
20150323681
Publication date
Nov 12, 2015
KABUSHIKI KAISHA TOSHIBA
Naoto KUME
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTION APPARATUS AND RADIATION DETECTON METHOD
Publication number
20150090889
Publication date
Apr 2, 2015
KABUSHIKI KAISHA TOSHIBA
Hidehiko KURODA
G01 - MEASURING TESTING
Information
Patent Application
COLOR SCINTILLATOR AND IMAGE SENSOR
Publication number
20090032718
Publication date
Feb 5, 2009
Kabushiki Kaisha Toshiba
Koichi NITTOH
G01 - MEASURING TESTING
Information
Patent Application
Color scintillator and image sensor
Publication number
20070069141
Publication date
Mar 29, 2007
Kabushiki Kaisha Toshiba
Koichi Nittoh
G01 - MEASURING TESTING