Kunihiko Shiozawa

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern data inspection method and storage medium
- Patent number 6,598,185
- Issue date Jul 22, 2003
- Fujitsu Limited
- Showgo Matsui
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System for inspecting exposure pattern data of semiconductor integr...
- Patent number 4,774,461
- Issue date Sep 27, 1988
- Fujitsu Limited
- Shogo Matsui
- G06 - COMPUTING CALCULATING COUNTING