Kunihiko TSUCHIYA

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Hamamatsu-shi, Shizuoka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Foreign matter inspection device
- Patent number 12,276,623
- Issue date Apr 15, 2025
- Hamamatsu Photonics K.K.
- Kunihiko Tsuchiya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT ME...
- Publication number 20240240933
- Publication date Jul 18, 2024
- Hamamatsu Photonics K.K.
- Kunihiko TSUCHIYA
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION DEVICE
- Publication number 20230288349
- Publication date Sep 14, 2023
- Hamamatsu Photonics K.K.
- Kunihiko TSUCHIYA
- G01 - MEASURING TESTING
Information Patent Application
HEIGHT MEASUREMENT APPARATUS AND HEIGHT MEASUREMENT METHOD
- Publication number 20230066638
- Publication date Mar 2, 2023
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
- Publication number 20230058064
- Publication date Feb 23, 2023
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING