Kunihiro ASADA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Power supply apparatus
- Patent number 10,088,858
- Issue date Oct 2, 2018
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Clock generating apparatus and clock data recovering apparatus
- Patent number 9,887,830
- Issue date Feb 6, 2018
- THINE ELECTRONICS, INC.
- Kunihiro Asada
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test apparatus
- Patent number 9,702,929
- Issue date Jul 11, 2017
- Advantest Corporation
- Masahiro Ishida
- G11 - INFORMATION STORAGE
Information Patent Grant
Detecting apparatus, wafer and electronic device
- Patent number 9,466,540
- Issue date Oct 11, 2016
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Signal conversion circuit, PLL circuit, delay adjustment circuit, a...
- Patent number 9,287,853
- Issue date Mar 15, 2016
- AIKA DESIGN INC.
- Toru Nakura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measurement apparatus and electronic device
- Patent number 9,057,745
- Issue date Jun 16, 2015
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POWER SUPPLY APPARATUS
- Publication number 20170220060
- Publication date Aug 3, 2017
- Advantest Corporation
- Masahiro ISHIDA
- G01 - MEASURING TESTING
Information Patent Application
CLOCK GENERATING APPARATUS AND CLOCK DATA RECOVERING APPARATUS
- Publication number 20170214513
- Publication date Jul 27, 2017
- THine Electronics, Inc.
- Kunihiro ASADA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DETECTING APPARATUS, WAFER AND ELECTRONIC DEVICE
- Publication number 20140197846
- Publication date Jul 17, 2014
- THE UNIVERSITY OF TOKYO
- Takahiro YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND ELECTRONIC DEVICE
- Publication number 20140184194
- Publication date Jul 3, 2014
- THE UNIVERSITY OF TOKYO
- Takahiro YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL CONVERSION CIRCUIT, PLL CIRCUIT, DELAY ADJUSTMENT CIRCUIT, A...
- Publication number 20140176205
- Publication date Jun 26, 2014
- AIKA DESIGN INC.
- Toru Nakura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST APPARATUS
- Publication number 20140091830
- Publication date Apr 3, 2014
- THE UNIVERSITY OF TOKYO
- Masahiro Ishida
- G01 - MEASURING TESTING