Membership
Tour
Register
Log in
Kunihiro HATAKEYAMA
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Distance-image capturing apparatus and distance-image capturing method
Patent number
11,982,750
Issue date
May 14, 2024
TOPPAN INC.
Tomoyuki Akahori
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RANGE IMAGING DEVICE AND RANGE IMAGING METHOD
Publication number
20240210535
Publication date
Jun 27, 2024
TOPPAN Holdings Inc.
Kunihiro HATAKEYAMA
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE IMAGE CAPTURING DEVICE AND DISTANCE IMAGE CAPTURING METHOD
Publication number
20240192335
Publication date
Jun 13, 2024
TOPPAN Holdings Inc.
Kunihiro HATAKEYAMA
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE IMAGE CAPTURING DEVICE AND DISTANCE IMAGE CAPTURING METHOD
Publication number
20240192374
Publication date
Jun 13, 2024
TOPPAN Holdings Inc.
Yasuyuki HITSUOKA
G01 - MEASURING TESTING
Information
Patent Application
RANGE IMAGING DEVICE AND RANGE IMAGING METHOD
Publication number
20240022833
Publication date
Jan 18, 2024
TOPPAN INC.
Kunihiro HATAKEYAMA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
RANGE IMAGING DEVICE AND RANGE IMAGING METHOD
Publication number
20230412934
Publication date
Dec 21, 2023
TOPPAN INC.
Yu OOKUBO
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
RANGE IMAGING DEVICE AND RANGE IMAGING METHOD
Publication number
20230366990
Publication date
Nov 16, 2023
TOPPAN INC.
Kunihiro HATAKEYAMA
G01 - MEASURING TESTING
Information
Patent Application
RANGE IMAGING APPARATUS AND RANGE IMAGING METHOD
Publication number
20230333218
Publication date
Oct 19, 2023
TOPPAN INC.
Kunihiro HATAKEYAMA
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE-IMAGE CAPTURING APPARATUS AND DISTANCE-IMAGE CAPTURING METHOD
Publication number
20220146684
Publication date
May 12, 2022
BROOKMAN TECHNOLOGY, INC.
Tomoyuki AKAHORI
G01 - MEASURING TESTING