Kunihiro Kasai

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device manufacturing method
- Patent number 7,687,368
- Issue date Mar 30, 2010
- Kabushiki Kaisha Toshiba
- Hirohisa Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 6,624,514
- Issue date Sep 23, 2003
- Kabushiki Kaisha Toshiba
- Kunihiro Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer, method of manufacturing the same and semicondu...
- Patent number 6,525,402
- Issue date Feb 25, 2003
- Kabushiki Kaisha Toshiba
- Masahiko Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having buried-type element isolation structure...
- Patent number 6,388,304
- Issue date May 14, 2002
- Kabushiki Kaisha Toshiba
- Fumitomo Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having buried-type element isolation structure...
- Patent number 6,248,645
- Issue date Jun 19, 2001
- Kabushiki Kaisha Toshiba
- Fumitomo Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of MOSFET having salicide structure
- Patent number 6,197,648
- Issue date Mar 6, 2001
- Kabushiki Kaisha Toshiba
- Kunihiro Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device having a test pad
- Patent number 6,008,061
- Issue date Dec 28, 1999
- Kabushiki Kaisha Toshiba
- Kunihiro Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Thin film transistor with conductive layer and static RAM with thin...
- Patent number 5,410,165
- Issue date Apr 25, 1995
- Kabushiki Kaisha Toshiba
- Kunihiro Kasai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device manufacturing method
- Publication number 20050282354
- Publication date Dec 22, 2005
- Hirohisa Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer, method of manufacturing the same and semicondu...
- Publication number 20030102530
- Publication date Jun 5, 2003
- Kabushiki Kaisha Toshiba
- Masahiko Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20020084526
- Publication date Jul 4, 2002
- Kunihiro Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having buried-type element isolation structure...
- Publication number 20010028097
- Publication date Oct 11, 2001
- Fumitomo Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS

Kunihiro Kasai

Person

Patents Grantslast 30 patents

Semiconductor device manufacturing method

Semiconductor device and manufacturing method thereof

Semiconductor wafer, method of manufacturing the same and semicondu...

Semiconductor device having buried-type element isolation structure...

Semiconductor device having buried-type element isolation structure...

Manufacturing method of MOSFET having salicide structure

Method of manufacturing semiconductor device having a test pad

Thin film transistor with conductive layer and static RAM with thin...

Patents Applicationslast 30 patents

Semiconductor device manufacturing method

Semiconductor wafer, method of manufacturing the same and semicondu...

Semiconductor device and manufacturing method thereof

Semiconductor device having buried-type element isolation structure...