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Kunikazu TAGUCHI
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Hirakata-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Optical measurement apparatus and optical measurement method
Patent number
12,111,146
Issue date
Oct 8, 2024
Otsuka Electronics Co., Ltd.
Kunikazu Taguchi
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement apparatus and optical measurement method
Patent number
11,215,443
Issue date
Jan 4, 2022
Otsuka Electronics Co., Ltd.
Kunikazu Taguchi
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement apparatus and optical measurement method
Patent number
10,309,767
Issue date
Jun 4, 2019
Otsuka Electronics Co., Ltd.
Nobuyuki Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement apparatus and optical measurement method
Patent number
10,288,412
Issue date
May 14, 2019
Otsuka Electronics Co., Ltd.
Nobuyuki Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Spectral characteristic measurement method and spectral characteris...
Patent number
8,941,829
Issue date
Jan 27, 2015
Otsuka Electronics Co., Ltd.
Hiroyuki Sano
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement apparatus, optical measurement system, and fibe...
Patent number
8,456,638
Issue date
Jun 4, 2013
Otsuka Electronics Co., Ltd.
Kazuaki Ohkubo
G01 - MEASURING TESTING
Information
Patent Grant
Automatic optical measurement method
Patent number
6,922,247
Issue date
Jul 26, 2005
Otsuka Electronics Co., Ltd.
Naoki Inamoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
Publication number
20210223028
Publication date
Jul 22, 2021
Otsuka Electronics Co., Ltd.
Kunikazu TAGUCHI
G02 - OPTICS
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
Publication number
20210123721
Publication date
Apr 29, 2021
Otsuka Electronics Co., Ltd.
Kunikazu TAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
Publication number
20180347965
Publication date
Dec 6, 2018
Otsuka Electronics Co., Ltd.
Nobuyuki INOUE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
Publication number
20180347964
Publication date
Dec 6, 2018
Otsuka Electronics Co., Ltd.
Nobuyuki INOUE
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL CHARACTERISTIC MEASUREMENT METHOD AND SPECTRAL CHARACTERIS...
Publication number
20120229803
Publication date
Sep 13, 2012
Otsuka Electronics Co., Ltd.
Hiroyuki SANO
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT SYSTEM, AND FIBE...
Publication number
20110235036
Publication date
Sep 29, 2011
Otsuka Electronics Co., Ltd.
Kazuaki OHKUBO
G01 - MEASURING TESTING
Information
Patent Application
Multipoint measurement system and method
Publication number
20040189979
Publication date
Sep 30, 2004
Shinji Fujimura
G01 - MEASURING TESTING
Information
Patent Application
Automatic optical measurement method
Publication number
20030147081
Publication date
Aug 7, 2003
Naoki Inamoto
G01 - MEASURING TESTING