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Kunio Kodama
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Kawasaki, JP
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last 30 patents
Information
Patent Grant
Method of manufacturing solder bumps and solder joints using formic...
Patent number
6,344,407
Issue date
Feb 5, 2002
Fujitsu Limited
Hirohisa Matsuki
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor device with flip chip bonding pads and manufacture th...
Patent number
6,218,281
Issue date
Apr 17, 2001
Fujitsu Limited
Eiji Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test board for testing a semiconductor device and method of testing...
Patent number
5,854,558
Issue date
Dec 29, 1998
Fujitsu Limited
Toshiyuki Motooka
G01 - MEASURING TESTING
Information
Patent Grant
Test board for testing a semiconductor device, method of testing th...
Patent number
5,831,441
Issue date
Nov 3, 1998
Fujitsu Limited
Toshiyuki Motooka
G01 - MEASURING TESTING