Kunio OHTSUKI

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analyzer
- Patent number 8,305,574
- Issue date Nov 6, 2012
- Horiba, Ltd.
- Kimihiko Arimoto
- G01 - MEASURING TESTING
Information Patent Grant
Particle inspection and removal apparatus and particle inspection a...
- Patent number 8,279,432
- Issue date Oct 2, 2012
- Horiba, Ltd.
- Toyoki Kanzaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYZER
- Publication number 20110043792
- Publication date Feb 24, 2011
- Horiba, Ltd.
- Kimihiko ARIMOTO
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE INSPECTION AND REMOVAL APPARATUS AND PARTICLE INSPECTION A...
- Publication number 20100229902
- Publication date Sep 16, 2010
- Horiba, Ltd.
- Toyoki KANZAKI
- G01 - MEASURING TESTING