Kunio Otsuki

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Minami-ku, JP

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Patents Grantslast 30 patents

Information Patent Grant
Film thickness measuring apparatus
- Patent number 6,795,185
- Issue date Sep 21, 2004
- Horiba, Ltd.
- Tomoya Yoshizawa
- G01 - MEASURING TESTING
Information Patent Grant
Spectral ellipsometer without chromatic aberrations
- Patent number 6,714,301
- Issue date Mar 30, 2004
- Horiba, Ltd.
- Kunio Otsuki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray irradiation apparatus provided with irradiation range monitor
- Patent number 4,969,177
- Issue date Nov 6, 1990
- Horiba, Ltd.
- Kunio Otsuki
- G01 - MEASURING TESTING
Information Patent Grant
Continuous particulate-measuring apparatus using an optoacoustic ef...
- Patent number 4,594,004
- Issue date Jun 10, 1986
- Horiba, Ltd.
- Kozo Ishida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Film thickness measuring apparatus
- Publication number 20020154319
- Publication date Oct 24, 2002
- Tomoya Yoshizawa
- G01 - MEASURING TESTING
Information Patent Application
Spectral ellipsometer without chromatic aberrations
- Publication number 20020126284
- Publication date Sep 12, 2002
- Kunio Otsuki
- G01 - MEASURING TESTING