Kunitoshi Nishimura

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Tsukuba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Microscopic geometry measuring device
- Patent number 6,604,295
- Issue date Aug 12, 2003
- Mitutoyo Corporation
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Touch signal probe
- Patent number 6,516,529
- Issue date Feb 11, 2003
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Touch signal probe
- Patent number 6,327,789
- Issue date Dec 11, 2001
- Mitutoyo Corp.
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Micro-geometry measuring device
- Patent number 6,314,800
- Issue date Nov 13, 2001
- Mitutoyo Corporation
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Non-directional touch signal probe
- Patent number 6,215,225
- Issue date Apr 10, 2001
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Length measuring machine and method using laser beams
- Patent number 6,034,773
- Issue date Mar 7, 2000
- Mitutoyo Corporation
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Touch probe with reseat position system
- Patent number 5,756,886
- Issue date May 26, 1998
- Mitutoyo Corporation
- Kunitoshi Nishimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Microscopic geometry measuring device
- Publication number 20020124427
- Publication date Sep 12, 2002
- Mitutoyo Corporation
- Kunitoshi Nishimura
- B82 - NANO-TECHNOLOGY
Information Patent Application
Touch signal probe
- Publication number 20010054237
- Publication date Dec 27, 2001
- Kazuhiko Hidaka
- G01 - MEASURING TESTING