Kunitoshi Yamamoto

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pin-scan-in type LSI logic circuit, pin-scan-in system driving circ...
- Patent number 5,612,962
- Issue date Mar 18, 1997
- Fujitsu Limited
- Toshiro Sato
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring clock pulse delay in one or more circuits
- Patent number 5,329,240
- Issue date Jul 12, 1994
- Fujitsu Limited
- Katsuhisa Kubota
- G06 - COMPUTING CALCULATING COUNTING