Kuniyasu Nakamura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and method of controlling charged p...
- Patent number 11,756,764
- Issue date Sep 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and charged particle beam device having an aperture wi...
- Patent number 9,293,293
- Issue date Mar 22, 2016
- Hitachi High-Technologies Corporation
- Shun-ichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and scanning transmission electron mic...
- Patent number 8,878,130
- Issue date Nov 4, 2014
- Hitachi High-Technologies Corporation
- Hiromi Inada
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission electron microscope and axial adjustment meth...
- Patent number 8,710,438
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number D571385
- Issue date Jun 17, 2008
- Hitachi High-Technologies Corporation
- Mitsuru Onuma
- D16 - Photography and optical equipment
Information Patent Grant
Scanning transmission electron microscope and scanning transmission...
- Patent number 7,372,029
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and electron energy loss...
- Patent number 7,285,776
- Issue date Oct 23, 2007
- Hitachi High-Technologies Corporation
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and scanning transmission...
- Patent number 7,227,144
- Issue date Jun 5, 2007
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bio electron microscope and observation method of specimen
- Patent number 6,875,984
- Issue date Apr 5, 2005
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning transmission electron microscopy
- Patent number 6,822,233
- Issue date Nov 23, 2004
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation apparatus and observation method using an electron beam
- Patent number 6,750,451
- Issue date Jun 15, 2004
- Hitachi, Ltd.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope apparatus with equipment for inspe...
- Patent number 6,548,811
- Issue date Apr 15, 2003
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning transmission electron microscopy
- Patent number 6,531,697
- Issue date Mar 11, 2003
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 6,051,834
- Issue date Apr 18, 2000
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,866,905
- Issue date Feb 2, 1999
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD OF CONTROLLING CHARGED P...
- Publication number 20220216034
- Publication date Jul 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi DOBASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20140197336
- Publication date Jul 17, 2014
- Hitachi High-Technologies Corporation
- Shun-ichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND SCANNING TRANSMISSION ELECTRON MIC...
- Publication number 20140138542
- Publication date May 22, 2014
- Hitachi High-Technologies Corporation
- Hiromi Inada
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TRANSMISSION ELECTRON MICROSCOPE AND AXIAL ADJUSTMENT METH...
- Publication number 20130112875
- Publication date May 9, 2013
- Hitachi High-Technologies Corporation
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning transmission electron microscope and scanning transmission...
- Publication number 20070228277
- Publication date Oct 4, 2007
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and measuring method of aberration coefficient of scannin...
- Publication number 20070158568
- Publication date Jul 12, 2007
- Taisuke Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and adjusting method for a scanning transmission electron...
- Publication number 20070158567
- Publication date Jul 12, 2007
- Taisuke Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning transmission electron microscope and scanning transmission...
- Publication number 20060151701
- Publication date Jul 13, 2006
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning transmission electron microscope and electron energy loss...
- Publication number 20050285037
- Publication date Dec 29, 2005
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bio electron microscope and observation method of specimen
- Publication number 20040135083
- Publication date Jul 15, 2004
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for scanning transmission electron microscopy
- Publication number 20030127595
- Publication date Jul 10, 2003
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Observation apparatus and observation method using an electron beam
- Publication number 20030006373
- Publication date Jan 9, 2003
- HITACHI LTD.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS

Kuniyasu Nakamura

Person

Patents Grantslast 30 patents

Charged particle beam apparatus and method of controlling charged p...

Electron gun and charged particle beam device having an aperture wi...

Scanning electron microscope and scanning transmission electron mic...

Scanning transmission electron microscope and axial adjustment meth...

Electron microscope

Scanning transmission electron microscope and scanning transmission...

Scanning transmission electron microscope and electron energy loss...

Scanning transmission electron microscope and scanning transmission...

Bio electron microscope and observation method of specimen

Method and apparatus for scanning transmission electron microscopy

Observation apparatus and observation method using an electron beam

Transmission electron microscope apparatus with equipment for inspe...

Method and apparatus for scanning transmission electron microscopy

Electron microscope

Electron microscope

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM APPARATUS AND METHOD OF CONTROLLING CHARGED P...

ELECTRON GUN AND CHARGED PARTICLE BEAM DEVICE

SCANNING ELECTRON MICROSCOPE AND SCANNING TRANSMISSION ELECTRON MIC...

SCANNING TRANSMISSION ELECTRON MICROSCOPE AND AXIAL ADJUSTMENT METH...

Scanning transmission electron microscope and scanning transmission...

Apparatus and measuring method of aberration coefficient of scannin...

Apparatus and adjusting method for a scanning transmission electron...

Scanning transmission electron microscope and scanning transmission...

Scanning transmission electron microscope and electron energy loss...

Bio electron microscope and observation method of specimen

Method and apparatus for scanning transmission electron microscopy

Observation apparatus and observation method using an electron beam